NON-CONTACT VOLTAGE MEASUREMENT DEVICE

There is provided a non-contact voltage measurement device (1) which can precisely measure a measurement target voltage by suppressing a flow of a leakage current via a parasitic capacitance (C ppL ) produced between an electric field shield (12) and an electric circuit (EC). A drive voltage applyin...

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Hauptverfasser:	IMAI, Hiroshi, MATSUURA, Keiki, TOKUSAKI, Hiroyuki, OGIMOTO, Mao
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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creator	IMAI, Hiroshi MATSUURA, Keiki TOKUSAKI, Hiroyuki OGIMOTO, Mao
description	There is provided a non-contact voltage measurement device (1) which can precisely measure a measurement target voltage by suppressing a flow of a leakage current via a parasitic capacitance (C ppL ) produced between an electric field shield (12) and an electric circuit (EC). A drive voltage applying unit (16) applies a voltage generated from an output voltage (V out ) of a low impedance unit (LOW) of the electric circuit (EC) and equal to an input voltage (V in ) of a high impedance unit (HI), to a first electric field shield (12A) coated on the high impedance unit (HI).
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subjects	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
title	NON-CONTACT VOLTAGE MEASUREMENT DEVICE
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