SAMPLE TARGET FOR IMPROVED ACCURACY OF COLOR MEASUREMENTS AND COLOR MEASUREMENTS USING THE SAME

Exemplary embodiments of the present disclosure are related to a color target and methods and systems for estimating a spectral reflectance of the color target based on an image of the color target. The color target can include a substrate having a target surface, a sample window formed in the subst...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	SNADER, Jeremiah, YADAV, Niti, MORA, Leonel Fernando, CALAS, Olivier Jr, VOGH, James William Jr
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page
container_issue
container_start_page
container_title
container_volume
creator	SNADER, Jeremiah YADAV, Niti MORA, Leonel Fernando CALAS, Olivier Jr VOGH, James William Jr
description	Exemplary embodiments of the present disclosure are related to a color target and methods and systems for estimating a spectral reflectance of the color target based on an image of the color target. The color target can include a substrate having a target surface, a sample window formed in the substrate and defining perimeter within which a sample surface is disposed, and one or more filters disposed the sample surface. The one or more filters are configured to cover a first portion of the sample surface, while leaving a second portion of the sample surface uncovered.
format	Patent
fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3112827A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3112827A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3112827A13</originalsourceid><addsrcrecordid>eNrjZIgPdvQN8HFVCHEMcncNUXDzD1Lw9A0I8g9zdVFwdHYODXJ0jlTwd1Nw9vcBSvm6OgaHBrn6uvqFBCs4-rlgEw4N9vRzVwjxcFUAGu3Kw8CalphTnMoLpbkZFNxcQ5w9dFML8uNTiwsSk1PzUkviXQOMDQ2NLIzMHQ2NiVACAO4NMsQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SAMPLE TARGET FOR IMPROVED ACCURACY OF COLOR MEASUREMENTS AND COLOR MEASUREMENTS USING THE SAME</title><source>esp@cenet</source><creator>SNADER, Jeremiah ; YADAV, Niti ; MORA, Leonel Fernando ; CALAS, Olivier Jr ; VOGH, James William Jr</creator><creatorcontrib>SNADER, Jeremiah ; YADAV, Niti ; MORA, Leonel Fernando ; CALAS, Olivier Jr ; VOGH, James William Jr</creatorcontrib><description>Exemplary embodiments of the present disclosure are related to a color target and methods and systems for estimating a spectral reflectance of the color target based on an image of the color target. The color target can include a substrate having a target surface, a sample window formed in the substrate and defining perimeter within which a sample surface is disposed, and one or more filters disposed the sample surface. The one or more filters are configured to cover a first portion of the sample surface, while leaving a second portion of the sample surface uncovered.</description><language>eng ; fre ; ger</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170104&DB=EPODOC&CC=EP&NR=3112827A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170104&DB=EPODOC&CC=EP&NR=3112827A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SNADER, Jeremiah</creatorcontrib><creatorcontrib>YADAV, Niti</creatorcontrib><creatorcontrib>MORA, Leonel Fernando</creatorcontrib><creatorcontrib>CALAS, Olivier Jr</creatorcontrib><creatorcontrib>VOGH, James William Jr</creatorcontrib><title>SAMPLE TARGET FOR IMPROVED ACCURACY OF COLOR MEASUREMENTS AND COLOR MEASUREMENTS USING THE SAME</title><description>Exemplary embodiments of the present disclosure are related to a color target and methods and systems for estimating a spectral reflectance of the color target based on an image of the color target. The color target can include a substrate having a target surface, a sample window formed in the substrate and defining perimeter within which a sample surface is disposed, and one or more filters disposed the sample surface. The one or more filters are configured to cover a first portion of the sample surface, while leaving a second portion of the sample surface uncovered.</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIgPdvQN8HFVCHEMcncNUXDzD1Lw9A0I8g9zdVFwdHYODXJ0jlTwd1Nw9vcBSvm6OgaHBrn6uvqFBCs4-rlgEw4N9vRzVwjxcFUAGu3Kw8CalphTnMoLpbkZFNxcQ5w9dFML8uNTiwsSk1PzUkviXQOMDQ2NLIzMHQ2NiVACAO4NMsQ</recordid><startdate>20170104</startdate><enddate>20170104</enddate><creator>SNADER, Jeremiah</creator><creator>YADAV, Niti</creator><creator>MORA, Leonel Fernando</creator><creator>CALAS, Olivier Jr</creator><creator>VOGH, James William Jr</creator><scope>EVB</scope></search><sort><creationdate>20170104</creationdate><title>SAMPLE TARGET FOR IMPROVED ACCURACY OF COLOR MEASUREMENTS AND COLOR MEASUREMENTS USING THE SAME</title><author>SNADER, Jeremiah ; YADAV, Niti ; MORA, Leonel Fernando ; CALAS, Olivier Jr ; VOGH, James William Jr</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3112827A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2017</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SNADER, Jeremiah</creatorcontrib><creatorcontrib>YADAV, Niti</creatorcontrib><creatorcontrib>MORA, Leonel Fernando</creatorcontrib><creatorcontrib>CALAS, Olivier Jr</creatorcontrib><creatorcontrib>VOGH, James William Jr</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SNADER, Jeremiah</au><au>YADAV, Niti</au><au>MORA, Leonel Fernando</au><au>CALAS, Olivier Jr</au><au>VOGH, James William Jr</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SAMPLE TARGET FOR IMPROVED ACCURACY OF COLOR MEASUREMENTS AND COLOR MEASUREMENTS USING THE SAME</title><date>2017-01-04</date><risdate>2017</risdate><abstract>Exemplary embodiments of the present disclosure are related to a color target and methods and systems for estimating a spectral reflectance of the color target based on an image of the color target. The color target can include a substrate having a target surface, a sample window formed in the substrate and defining perimeter within which a sample surface is disposed, and one or more filters disposed the sample surface. The one or more filters are configured to cover a first portion of the sample surface, while leaving a second portion of the sample surface uncovered.</abstract><oa>free_for_read</oa></addata></record>
fulltext	fulltext_linktorsrc
identifier
ispartof
issn
language	eng ; fre ; ger
recordid	cdi_epo_espacenet_EP3112827A1
source	esp@cenet
subjects	COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
title	SAMPLE TARGET FOR IMPROVED ACCURACY OF COLOR MEASUREMENTS AND COLOR MEASUREMENTS USING THE SAME
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T05%3A07%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SNADER,%20Jeremiah&rft.date=2017-01-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP3112827A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true