SYSTEMS AND METHODS FOR AUTOMATICALLY INSPECTING WIRE SEGMENTS

SYSTEMS AND METHODS FOR AUTOMATICALLY INSPECTING WIRE SEGMENTS

A wire inspection system (600) is provided. The wire inspection system includes a mirror assembly (602) including an odd number of sides (606) arranged to form a pyramid structure configured to surround a wire segment (304, 402, 404, 406, 502, 504, 506), wherein a plurality of the sides include a mi...

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Hauptverfasser: GILLIS, James Ridgeway, NORTHON, Bentley Edwin, MITCHELL, Bradley J, RAY, Gary Alan
Format: Patent
Sprache:eng ; fre ; ger
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator GILLIS, James Ridgeway
NORTHON, Bentley Edwin
MITCHELL, Bradley J
RAY, Gary Alan
description A wire inspection system (600) is provided. The wire inspection system includes a mirror assembly (602) including an odd number of sides (606) arranged to form a pyramid structure configured to surround a wire segment (304, 402, 404, 406, 502, 504, 506), wherein a plurality of the sides include a mirror (604), a light source (612) configured to illuminate the wire segment, and at least one camera (610) configured to acquire a plurality of images of the wire segment that are reflected by the plurality of mirrors, wherein each image of the plurality of images shows a different side of the wire segment.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title SYSTEMS AND METHODS FOR AUTOMATICALLY INSPECTING WIRE SEGMENTS
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