FIELD-MAPPING AND FOCAL-SPOT TRACKING FOR S-SNOM

System and method for optical alignment of a near-field system, employing reiterative analysis of amplitude (irradiance) and phase maps of irradiated field obtained in back-scattered light while adjusting the system to arrive at field pattern indicative of and sensitive to a near-field optical wave...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ANDREEV, Gregory, OSECHINSKIY, Sergey
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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