SENSOR SELF-TEST

SENSOR SELF-TEST

A crystal self-test circuit is used to self-test either an acoustic emission crystal or a vibration crystal installed onto one of a bearing, a bearing housing, and a machine. A crystal self-test circuit includes a multiplexer IC, which toggles between a pulse injection configuration and a signal col...

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1. Verfasser: ERSKINE, JOSEPH
Format: Patent
Sprache:eng ; fre ; ger
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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creator ERSKINE, JOSEPH
description A crystal self-test circuit is used to self-test either an acoustic emission crystal or a vibration crystal installed onto one of a bearing, a bearing housing, and a machine. A crystal self-test circuit includes a multiplexer IC, which toggles between a pulse injection configuration and a signal collection configuration. In the pulse injection configuration, the multiplexer IC provides signal communication between a crystal self-test input and the sensing emission crystal. In the signal collection configuration, the multiplexer IC provides signal communication between the sensing emission crystal and a signal analyzer. In operation, the multiplexer IC applies a waveform (preferably a square wave) to the sensing emission crystal over a predetermined time period. The multiplexer IC then toggles to collect the output waveform from the sensing emission crystal and forwards the output waveform to the signal analyzer. The output signal can be amplified by a signal amplifier.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2976633A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2976633A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2976633A13</originalsourceid><addsrcrecordid>eNrjZBAIdvUL9g9SCHb1cdMNcQ0O4WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BRpbmZmbGxo6GxkQoAQDRih04</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SENSOR SELF-TEST</title><source>esp@cenet</source><creator>ERSKINE, JOSEPH</creator><creatorcontrib>ERSKINE, JOSEPH</creatorcontrib><description>A crystal self-test circuit is used to self-test either an acoustic emission crystal or a vibration crystal installed onto one of a bearing, a bearing housing, and a machine. A crystal self-test circuit includes a multiplexer IC, which toggles between a pulse injection configuration and a signal collection configuration. In the pulse injection configuration, the multiplexer IC provides signal communication between a crystal self-test input and the sensing emission crystal. In the signal collection configuration, the multiplexer IC provides signal communication between the sensing emission crystal and a signal analyzer. In operation, the multiplexer IC applies a waveform (preferably a square wave) to the sensing emission crystal over a predetermined time period. The multiplexer IC then toggles to collect the output waveform from the sensing emission crystal and forwards the output waveform to the signal analyzer. The output signal can be amplified by a signal amplifier.</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20160127&amp;DB=EPODOC&amp;CC=EP&amp;NR=2976633A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20160127&amp;DB=EPODOC&amp;CC=EP&amp;NR=2976633A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ERSKINE, JOSEPH</creatorcontrib><title>SENSOR SELF-TEST</title><description>A crystal self-test circuit is used to self-test either an acoustic emission crystal or a vibration crystal installed onto one of a bearing, a bearing housing, and a machine. A crystal self-test circuit includes a multiplexer IC, which toggles between a pulse injection configuration and a signal collection configuration. In the pulse injection configuration, the multiplexer IC provides signal communication between a crystal self-test input and the sensing emission crystal. In the signal collection configuration, the multiplexer IC provides signal communication between the sensing emission crystal and a signal analyzer. In operation, the multiplexer IC applies a waveform (preferably a square wave) to the sensing emission crystal over a predetermined time period. The multiplexer IC then toggles to collect the output waveform from the sensing emission crystal and forwards the output waveform to the signal analyzer. The output signal can be amplified by a signal amplifier.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAIdvUL9g9SCHb1cdMNcQ0O4WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BRpbmZmbGxo6GxkQoAQDRih04</recordid><startdate>20160127</startdate><enddate>20160127</enddate><creator>ERSKINE, JOSEPH</creator><scope>EVB</scope></search><sort><creationdate>20160127</creationdate><title>SENSOR SELF-TEST</title><author>ERSKINE, JOSEPH</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2976633A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2016</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>ERSKINE, JOSEPH</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ERSKINE, JOSEPH</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SENSOR SELF-TEST</title><date>2016-01-27</date><risdate>2016</risdate><abstract>A crystal self-test circuit is used to self-test either an acoustic emission crystal or a vibration crystal installed onto one of a bearing, a bearing housing, and a machine. A crystal self-test circuit includes a multiplexer IC, which toggles between a pulse injection configuration and a signal collection configuration. In the pulse injection configuration, the multiplexer IC provides signal communication between a crystal self-test input and the sensing emission crystal. In the signal collection configuration, the multiplexer IC provides signal communication between the sensing emission crystal and a signal analyzer. In operation, the multiplexer IC applies a waveform (preferably a square wave) to the sensing emission crystal over a predetermined time period. The multiplexer IC then toggles to collect the output waveform from the sensing emission crystal and forwards the output waveform to the signal analyzer. The output signal can be amplified by a signal amplifier.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title SENSOR SELF-TEST
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-12T20%3A15%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ERSKINE,%20JOSEPH&rft.date=2016-01-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2976633A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true