IMPROVEMENTS RELATING TO TEST DEVICES

IMPROVEMENTS RELATING TO TEST DEVICES

The invention relates to test devices such as diagnostic test devices. In particular the invention relates to individually packaged test devices. The invention also relates to methods of manufacturing such individually packaged test devices, use of such individually packaged test devices, and test d...

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1. Verfasser: O'REILLY, Tom Joseph
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator O'REILLY, Tom Joseph
description The invention relates to test devices such as diagnostic test devices. In particular the invention relates to individually packaged test devices. The invention also relates to methods of manufacturing such individually packaged test devices, use of such individually packaged test devices, and test device cards comprising two or more test devices. In particular, the invention relates to a test device comprising: a test strip having first and second major surfaces and comprising: a proximal portion for bearing contacts for a metering device, an intermediate portion for receiving a sample comprising a test area on the first major surface, the test area comprising at least one test component; a separable distal portion; and in which the test device further comprises: a cover leaf (optionally a removable cover leaf) having a portion (optionally a removable portion) extending over at least part of one of the major surfaces of the test strip so as to seal the test area and having a non-removable portion attached to the separable distal portion of the test strip.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title IMPROVEMENTS RELATING TO TEST DEVICES
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