IMPROVED REFRESH RATE PERFORMANCE BASED ON IN-SYSTEM WEAK BIT DETECTION

A memory subsystem can test a memory device in situ, testing the performance of the device in the system it is built into during production. Thus, the refresh rate can be adjusted specific to the memory device(s) of a specific system, rather than defaulting to a refresh frequency specified by a stan...

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Bibliographische Detailangaben

Hauptverfasser:	MOZAK, CHRISTOPHER P, SCHOENBORN, THEODORE Z
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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