INTEGRATED CIRCUIT WITH CHEMFET-SENSORS AND MEASURING METHOD

Integrated circuit (100) comprising a semiconductor substrate (110); an insulating layer (120) over said substrate; an first transistor (140) on said insulating layer, said first transistor comprising an exposed channel region (146) in between a source region (142a, 142b) and a drain region (144); a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ALARCON-RIVERO, Manuel, Eduardo, DE WILD, Nico, Maris, Adriaan, KLOOTWIJK, Johan, Hendrik, MESCHER, Marleen
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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