METHOD FOR THICKNESS MEASUREMENT ON MEASUREMENT OBJECTS AND DEVICE FOR APPLYING THE METHOD

A method for measuring the thickness on measurement objects, whereby at least one sensor measures against the object from the top and at least one other sensor measures against the object from the bottom and, at a known distance of the sensors to one another, the thickness of the object is calculate...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	SCHALLMOSER, GUENTER, FUELLMEIER, HERBERT
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page
container_issue
container_start_page
container_title
container_volume
creator	SCHALLMOSER, GUENTER FUELLMEIER, HERBERT
description	A method for measuring the thickness on measurement objects, whereby at least one sensor measures against the object from the top and at least one other sensor measures against the object from the bottom and, at a known distance of the sensors to one another, the thickness of the object is calculated according to the formula D=Gap−(S1+S2), whereby D=the thickness of the measurement object, Gap=the distance between the sensors, S1=the distance of the top sensor to the upper side of the measurement object, and S2=the distance of the bottom sensor to the underside of the measurement object, is characterized by the compensation of a measurement error caused by tilting of the measurement object and/or by displacement of the sensors and/or by tilting of the sensors, whereby the displacement and/or the tilting is determined by calibration and the calculated thickness or the calculated thickness profile is corrected accordingly. The invention further concerns a device for applying the method.
format	Patent
fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2909577A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2909577A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2909577A13</originalsourceid><addsrcrecordid>eNrjZIjydQ3x8HdRcPMPUgjx8HT29nMNDlbwdXUMDg1y9XX1C1Hw90PlOnm5OocEKzj6uSi4uIZ5OruC9ToGBPhEevq5Aw1xVYCYycPAmpaYU5zKC6W5GRTcXEOcPXRTC_LjU4sLEpNT81JL4l0DjCwNLE3NzR0NjYlQAgD2GjFu</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD FOR THICKNESS MEASUREMENT ON MEASUREMENT OBJECTS AND DEVICE FOR APPLYING THE METHOD</title><source>esp@cenet</source><creator>SCHALLMOSER, GUENTER ; FUELLMEIER, HERBERT</creator><creatorcontrib>SCHALLMOSER, GUENTER ; FUELLMEIER, HERBERT</creatorcontrib><description>A method for measuring the thickness on measurement objects, whereby at least one sensor measures against the object from the top and at least one other sensor measures against the object from the bottom and, at a known distance of the sensors to one another, the thickness of the object is calculated according to the formula D=Gap−(S1+S2), whereby D=the thickness of the measurement object, Gap=the distance between the sensors, S1=the distance of the top sensor to the upper side of the measurement object, and S2=the distance of the bottom sensor to the underside of the measurement object, is characterized by the compensation of a measurement error caused by tilting of the measurement object and/or by displacement of the sensors and/or by tilting of the sensors, whereby the displacement and/or the tilting is determined by calibration and the calculated thickness or the calculated thickness profile is corrected accordingly. The invention further concerns a device for applying the method.</description><language>eng ; fre ; ger</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150826&DB=EPODOC&CC=EP&NR=2909577A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150826&DB=EPODOC&CC=EP&NR=2909577A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SCHALLMOSER, GUENTER</creatorcontrib><creatorcontrib>FUELLMEIER, HERBERT</creatorcontrib><title>METHOD FOR THICKNESS MEASUREMENT ON MEASUREMENT OBJECTS AND DEVICE FOR APPLYING THE METHOD</title><description>A method for measuring the thickness on measurement objects, whereby at least one sensor measures against the object from the top and at least one other sensor measures against the object from the bottom and, at a known distance of the sensors to one another, the thickness of the object is calculated according to the formula D=Gap−(S1+S2), whereby D=the thickness of the measurement object, Gap=the distance between the sensors, S1=the distance of the top sensor to the upper side of the measurement object, and S2=the distance of the bottom sensor to the underside of the measurement object, is characterized by the compensation of a measurement error caused by tilting of the measurement object and/or by displacement of the sensors and/or by tilting of the sensors, whereby the displacement and/or the tilting is determined by calibration and the calculated thickness or the calculated thickness profile is corrected accordingly. The invention further concerns a device for applying the method.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIjydQ3x8HdRcPMPUgjx8HT29nMNDlbwdXUMDg1y9XX1C1Hw90PlOnm5OocEKzj6uSi4uIZ5OruC9ToGBPhEevq5Aw1xVYCYycPAmpaYU5zKC6W5GRTcXEOcPXRTC_LjU4sLEpNT81JL4l0DjCwNLE3NzR0NjYlQAgD2GjFu</recordid><startdate>20150826</startdate><enddate>20150826</enddate><creator>SCHALLMOSER, GUENTER</creator><creator>FUELLMEIER, HERBERT</creator><scope>EVB</scope></search><sort><creationdate>20150826</creationdate><title>METHOD FOR THICKNESS MEASUREMENT ON MEASUREMENT OBJECTS AND DEVICE FOR APPLYING THE METHOD</title><author>SCHALLMOSER, GUENTER ; FUELLMEIER, HERBERT</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2909577A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2015</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SCHALLMOSER, GUENTER</creatorcontrib><creatorcontrib>FUELLMEIER, HERBERT</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SCHALLMOSER, GUENTER</au><au>FUELLMEIER, HERBERT</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD FOR THICKNESS MEASUREMENT ON MEASUREMENT OBJECTS AND DEVICE FOR APPLYING THE METHOD</title><date>2015-08-26</date><risdate>2015</risdate><abstract>A method for measuring the thickness on measurement objects, whereby at least one sensor measures against the object from the top and at least one other sensor measures against the object from the bottom and, at a known distance of the sensors to one another, the thickness of the object is calculated according to the formula D=Gap−(S1+S2), whereby D=the thickness of the measurement object, Gap=the distance between the sensors, S1=the distance of the top sensor to the upper side of the measurement object, and S2=the distance of the bottom sensor to the underside of the measurement object, is characterized by the compensation of a measurement error caused by tilting of the measurement object and/or by displacement of the sensors and/or by tilting of the sensors, whereby the displacement and/or the tilting is determined by calibration and the calculated thickness or the calculated thickness profile is corrected accordingly. The invention further concerns a device for applying the method.</abstract><oa>free_for_read</oa></addata></record>
fulltext	fulltext_linktorsrc
identifier
ispartof
issn
language	eng ; fre ; ger
recordid	cdi_epo_espacenet_EP2909577A1
source	esp@cenet
subjects	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
title	METHOD FOR THICKNESS MEASUREMENT ON MEASUREMENT OBJECTS AND DEVICE FOR APPLYING THE METHOD
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-10T20%3A51%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SCHALLMOSER,%20GUENTER&rft.date=2015-08-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2909577A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true