SYSTEMS AND METHODS FOR MARKING IMAGES FOR THREE-DIMENSIONAL IMAGE GENERATION

SYSTEMS AND METHODS FOR MARKING IMAGES FOR THREE-DIMENSIONAL IMAGE GENERATION

Methods and systems for image marking and generation of a three-dimensional (3D) image of an object are described. In an example, a computing device may be configured to receive a first set of images of an object that capture details of the object. The computing device may also be configured to rece...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LEWIS, Thor, FRANCIS, Anthony, Gerald, Jr
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator LEWIS, Thor
FRANCIS, Anthony, Gerald, Jr
description Methods and systems for image marking and generation of a three-dimensional (3D) image of an object are described. In an example, a computing device may be configured to receive a first set of images of an object that capture details of the object. The computing device may also be configured to receive a second set of images that include markings projected on the object and that are indexed to correspond to images of the first set of images. The computing device may be configured to spatially align images of the second set of images based on the markings projected on the object and determine respective images of the first set of images corresponding to spatially aligned images of the second set of images. The computing device may then generate a 3D image of the object from the respective images of the first set of images.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2909575B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2909575B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2909575B13</originalsourceid><addsrcrecordid>eNrjZPANjgwOcfUNVnD0c1HwdQ3x8HcJVnDzD1LwdQzy9vRzV_D0dXR3hQiFeAS5uuq6ePq6-gV7-vs5-kAkFdxd_VyDHEOAQjwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrW4IDE5NS-1JN41wMjSwNLU3NTJ0JgIJQCLZC3b</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEMS AND METHODS FOR MARKING IMAGES FOR THREE-DIMENSIONAL IMAGE GENERATION</title><source>esp@cenet</source><creator>LEWIS, Thor ; FRANCIS, Anthony, Gerald, Jr</creator><creatorcontrib>LEWIS, Thor ; FRANCIS, Anthony, Gerald, Jr</creatorcontrib><description>Methods and systems for image marking and generation of a three-dimensional (3D) image of an object are described. In an example, a computing device may be configured to receive a first set of images of an object that capture details of the object. The computing device may also be configured to receive a second set of images that include markings projected on the object and that are indexed to correspond to images of the first set of images. The computing device may be configured to spatially align images of the second set of images based on the markings projected on the object and determine respective images of the first set of images corresponding to spatially aligned images of the second set of images. The computing device may then generate a 3D image of the object from the respective images of the first set of images.</description><language>eng ; fre ; ger</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20201007&amp;DB=EPODOC&amp;CC=EP&amp;NR=2909575B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20201007&amp;DB=EPODOC&amp;CC=EP&amp;NR=2909575B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEWIS, Thor</creatorcontrib><creatorcontrib>FRANCIS, Anthony, Gerald, Jr</creatorcontrib><title>SYSTEMS AND METHODS FOR MARKING IMAGES FOR THREE-DIMENSIONAL IMAGE GENERATION</title><description>Methods and systems for image marking and generation of a three-dimensional (3D) image of an object are described. In an example, a computing device may be configured to receive a first set of images of an object that capture details of the object. The computing device may also be configured to receive a second set of images that include markings projected on the object and that are indexed to correspond to images of the first set of images. The computing device may be configured to spatially align images of the second set of images based on the markings projected on the object and determine respective images of the first set of images corresponding to spatially aligned images of the second set of images. The computing device may then generate a 3D image of the object from the respective images of the first set of images.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPANjgwOcfUNVnD0c1HwdQ3x8HcJVnDzD1LwdQzy9vRzV_D0dXR3hQiFeAS5uuq6ePq6-gV7-vs5-kAkFdxd_VyDHEOAQjwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrW4IDE5NS-1JN41wMjSwNLU3NTJ0JgIJQCLZC3b</recordid><startdate>20201007</startdate><enddate>20201007</enddate><creator>LEWIS, Thor</creator><creator>FRANCIS, Anthony, Gerald, Jr</creator><scope>EVB</scope></search><sort><creationdate>20201007</creationdate><title>SYSTEMS AND METHODS FOR MARKING IMAGES FOR THREE-DIMENSIONAL IMAGE GENERATION</title><author>LEWIS, Thor ; FRANCIS, Anthony, Gerald, Jr</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2909575B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2020</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LEWIS, Thor</creatorcontrib><creatorcontrib>FRANCIS, Anthony, Gerald, Jr</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEWIS, Thor</au><au>FRANCIS, Anthony, Gerald, Jr</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEMS AND METHODS FOR MARKING IMAGES FOR THREE-DIMENSIONAL IMAGE GENERATION</title><date>2020-10-07</date><risdate>2020</risdate><abstract>Methods and systems for image marking and generation of a three-dimensional (3D) image of an object are described. In an example, a computing device may be configured to receive a first set of images of an object that capture details of the object. The computing device may also be configured to receive a second set of images that include markings projected on the object and that are indexed to correspond to images of the first set of images. The computing device may be configured to spatially align images of the second set of images based on the markings projected on the object and determine respective images of the first set of images corresponding to spatially aligned images of the second set of images. The computing device may then generate a 3D image of the object from the respective images of the first set of images.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP2909575B1
source esp@cenet
subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title SYSTEMS AND METHODS FOR MARKING IMAGES FOR THREE-DIMENSIONAL IMAGE GENERATION
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T16%3A35%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LEWIS,%20Thor&rft.date=2020-10-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2909575B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true