OPTICAL SENSOR FOR ANALYTE DETECTION

OPTICAL SENSOR FOR ANALYTE DETECTION

Devices, systems, and methods for detection of an analyte in a sample are disclosed. In some embodiments, an optical sensor (100) can include a light source (110), a detector (120), a metallic layer (104) and a plurality of dielectric pillars (106) extending through the metallic layer. The metallic...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: JONES, William, Maxwell, HOMYK, Andrew Peter, TRUONG, Thai Viet, SCHERER, Axel, FRASER, Scott, WALAVALKAR, Sameer Sudhir
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator JONES, William, Maxwell
HOMYK, Andrew Peter
TRUONG, Thai Viet
SCHERER, Axel
FRASER, Scott
WALAVALKAR, Sameer Sudhir
description Devices, systems, and methods for detection of an analyte in a sample are disclosed. In some embodiments, an optical sensor (100) can include a light source (110), a detector (120), a metallic layer (104) and a plurality of dielectric pillars (106) extending through the metallic layer. The metallic layer (104) and the plurality of dielectric pillars (106) are designed such that a plurality of regions of concentrated light (107) can be supported in proximity to the ends of the plurality of dielectric pillars (106) at one side of the metallic layer thereof when an opposite surface of the metallic layer is illuminated by the light source. Concentrated light within one or more of these regions can interact with an analyte molecule (112) and can be detected by the detector (120) positioned on the same side as these regions, allowing for detection of the analyte .
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2904376B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2904376B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2904376B13</originalsourceid><addsrcrecordid>eNrjZFDxDwjxdHb0UQh29Qv2D1JwA2JHP0efyBBXBRfXEFfnEE9_Px4G1rTEnOJUXijNzaDg5hri7KGbWpAfn1pckJicmpdaEu8aYGRpYGJsbuZkaEyEEgA-8iKt</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>OPTICAL SENSOR FOR ANALYTE DETECTION</title><source>esp@cenet</source><creator>JONES, William, Maxwell ; HOMYK, Andrew Peter ; TRUONG, Thai Viet ; SCHERER, Axel ; FRASER, Scott ; WALAVALKAR, Sameer Sudhir</creator><creatorcontrib>JONES, William, Maxwell ; HOMYK, Andrew Peter ; TRUONG, Thai Viet ; SCHERER, Axel ; FRASER, Scott ; WALAVALKAR, Sameer Sudhir</creatorcontrib><description>Devices, systems, and methods for detection of an analyte in a sample are disclosed. In some embodiments, an optical sensor (100) can include a light source (110), a detector (120), a metallic layer (104) and a plurality of dielectric pillars (106) extending through the metallic layer. The metallic layer (104) and the plurality of dielectric pillars (106) are designed such that a plurality of regions of concentrated light (107) can be supported in proximity to the ends of the plurality of dielectric pillars (106) at one side of the metallic layer thereof when an opposite surface of the metallic layer is illuminated by the light source. Concentrated light within one or more of these regions can interact with an analyte molecule (112) and can be detected by the detector (120) positioned on the same side as these regions, allowing for detection of the analyte .</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190213&amp;DB=EPODOC&amp;CC=EP&amp;NR=2904376B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190213&amp;DB=EPODOC&amp;CC=EP&amp;NR=2904376B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JONES, William, Maxwell</creatorcontrib><creatorcontrib>HOMYK, Andrew Peter</creatorcontrib><creatorcontrib>TRUONG, Thai Viet</creatorcontrib><creatorcontrib>SCHERER, Axel</creatorcontrib><creatorcontrib>FRASER, Scott</creatorcontrib><creatorcontrib>WALAVALKAR, Sameer Sudhir</creatorcontrib><title>OPTICAL SENSOR FOR ANALYTE DETECTION</title><description>Devices, systems, and methods for detection of an analyte in a sample are disclosed. In some embodiments, an optical sensor (100) can include a light source (110), a detector (120), a metallic layer (104) and a plurality of dielectric pillars (106) extending through the metallic layer. The metallic layer (104) and the plurality of dielectric pillars (106) are designed such that a plurality of regions of concentrated light (107) can be supported in proximity to the ends of the plurality of dielectric pillars (106) at one side of the metallic layer thereof when an opposite surface of the metallic layer is illuminated by the light source. Concentrated light within one or more of these regions can interact with an analyte molecule (112) and can be detected by the detector (120) positioned on the same side as these regions, allowing for detection of the analyte .</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFDxDwjxdHb0UQh29Qv2D1JwA2JHP0efyBBXBRfXEFfnEE9_Px4G1rTEnOJUXijNzaDg5hri7KGbWpAfn1pckJicmpdaEu8aYGRpYGJsbuZkaEyEEgA-8iKt</recordid><startdate>20190213</startdate><enddate>20190213</enddate><creator>JONES, William, Maxwell</creator><creator>HOMYK, Andrew Peter</creator><creator>TRUONG, Thai Viet</creator><creator>SCHERER, Axel</creator><creator>FRASER, Scott</creator><creator>WALAVALKAR, Sameer Sudhir</creator><scope>EVB</scope></search><sort><creationdate>20190213</creationdate><title>OPTICAL SENSOR FOR ANALYTE DETECTION</title><author>JONES, William, Maxwell ; HOMYK, Andrew Peter ; TRUONG, Thai Viet ; SCHERER, Axel ; FRASER, Scott ; WALAVALKAR, Sameer Sudhir</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2904376B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2019</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JONES, William, Maxwell</creatorcontrib><creatorcontrib>HOMYK, Andrew Peter</creatorcontrib><creatorcontrib>TRUONG, Thai Viet</creatorcontrib><creatorcontrib>SCHERER, Axel</creatorcontrib><creatorcontrib>FRASER, Scott</creatorcontrib><creatorcontrib>WALAVALKAR, Sameer Sudhir</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JONES, William, Maxwell</au><au>HOMYK, Andrew Peter</au><au>TRUONG, Thai Viet</au><au>SCHERER, Axel</au><au>FRASER, Scott</au><au>WALAVALKAR, Sameer Sudhir</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>OPTICAL SENSOR FOR ANALYTE DETECTION</title><date>2019-02-13</date><risdate>2019</risdate><abstract>Devices, systems, and methods for detection of an analyte in a sample are disclosed. In some embodiments, an optical sensor (100) can include a light source (110), a detector (120), a metallic layer (104) and a plurality of dielectric pillars (106) extending through the metallic layer. The metallic layer (104) and the plurality of dielectric pillars (106) are designed such that a plurality of regions of concentrated light (107) can be supported in proximity to the ends of the plurality of dielectric pillars (106) at one side of the metallic layer thereof when an opposite surface of the metallic layer is illuminated by the light source. Concentrated light within one or more of these regions can interact with an analyte molecule (112) and can be detected by the detector (120) positioned on the same side as these regions, allowing for detection of the analyte .</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP2904376B1
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title OPTICAL SENSOR FOR ANALYTE DETECTION
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T00%3A03%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=JONES,%20William,%20Maxwell&rft.date=2019-02-13&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2904376B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true