AUTOMATIC MICROSCOPIC FOCUS SYSTEM AND METHOD FOR ANALYSIS OF TRANSPARENT OR LOW CONTRAST SPECIMENS

AUTOMATIC MICROSCOPIC FOCUS SYSTEM AND METHOD FOR ANALYSIS OF TRANSPARENT OR LOW CONTRAST SPECIMENS

A microscope system and method empirically determines the boundaries of the depth of field of an objective lens. The system and method are largely automated, with the manipulation of a specimen to be imaged being carried out by processors and associated equipment. Calculations of the empirical depth...

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Hauptverfasser: PUTMAN, MATTHEW C, ARCHER, JEFFREY S, PUTMAN, JOHN B, ORLANDO, JULIE A
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
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creator PUTMAN, MATTHEW C
ARCHER, JEFFREY S
PUTMAN, JOHN B
ORLANDO, JULIE A
description A microscope system and method empirically determines the boundaries of the depth of field of an objective lens. The system and method are largely automated, with the manipulation of a specimen to be imaged being carried out by processors and associated equipment. Calculations of the empirical depth of field are also likewise automated. Upon empirically determining the boundaries of the depth of field, the specimen, particularly when transparent or translucent, can be accurately imaged at user-defined depths smaller than the depth of field.
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subjects ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
title AUTOMATIC MICROSCOPIC FOCUS SYSTEM AND METHOD FOR ANALYSIS OF TRANSPARENT OR LOW CONTRAST SPECIMENS
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