Thermal-type infrared sensor and image forming apparatus
A thermal-type infrared sensor includes a thermopile (2); an electrical conduction path of the thermopile (2), the conduction path including at least one crossed section (14) in which the conduction path is crossed; a first region (2a) that is closed or substantially closed and formed by part of the...
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creator | NOGUCHI, HIDETAKA |
description | A thermal-type infrared sensor includes a thermopile (2); an electrical conduction path of the thermopile (2), the conduction path including at least one crossed section (14) in which the conduction path is crossed; a first region (2a) that is closed or substantially closed and formed by part of the conduction path, the part of the conduction path including an output section (5a,5b) of the conduction path and the at least one crossed section (14); and a second region (2b) that is closed or substantially closed and formed by another part of the conduction path having the at least one crossed section (14) as a boundary. The first region (2a) and the second region (2b) do not overlap each other. |
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The first region (2a) and the second region (2b) do not overlap each other.</description><language>eng ; fre ; ger</language><subject>COLORIMETRY ; ELECTRICITY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150408&DB=EPODOC&CC=EP&NR=2857814A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150408&DB=EPODOC&CC=EP&NR=2857814A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NOGUCHI, HIDETAKA</creatorcontrib><title>Thermal-type infrared sensor and image forming apparatus</title><description>A thermal-type infrared sensor includes a thermopile (2); an electrical conduction path of the thermopile (2), the conduction path including at least one crossed section (14) in which the conduction path is crossed; a first region (2a) that is closed or substantially closed and formed by part of the conduction path, the part of the conduction path including an output section (5a,5b) of the conduction path and the at least one crossed section (14); and a second region (2b) that is closed or substantially closed and formed by another part of the conduction path having the at least one crossed section (14) as a boundary. 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language | eng ; fre ; ger |
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subjects | COLORIMETRY ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
title | Thermal-type infrared sensor and image forming apparatus |
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