Substrate defect detection mechanism
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre ; ger |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Walker, Casey Ethan Johnson, Scott Richard Lewis, Harry Reese |
| description | |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2848921B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2848921B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2848921B13</originalsourceid><addsrcrecordid>eNrjZFAJLk0qLilKLElVSElNS00uAVIlQCozP08hNzU5IzEvsziXh4E1LTGnOJUXSnMzKLi5hjh76KYW5MenFhckJqfmpZbEuwYYWZhYWBoZOhkaE6EEAOGZJrU</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Substrate defect detection mechanism</title><source>esp@cenet</source><creator>Walker, Casey Ethan ; Johnson, Scott Richard ; Lewis, Harry Reese</creator><creatorcontrib>Walker, Casey Ethan ; Johnson, Scott Richard ; Lewis, Harry Reese</creatorcontrib><language>eng ; fre ; ger</language><subject>CORRECTION OF TYPOGRAPHICAL ERRORS ; i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; LINING MACHINES ; MEASURING ; PERFORMING OPERATIONS ; PHYSICS ; PRINTING ; SELECTIVE PRINTING MECHANISMS ; STAMPS ; TESTING ; TRANSPORTING ; TYPEWRITERS</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170412&DB=EPODOC&CC=EP&NR=2848921B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170412&DB=EPODOC&CC=EP&NR=2848921B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Walker, Casey Ethan</creatorcontrib><creatorcontrib>Johnson, Scott Richard</creatorcontrib><creatorcontrib>Lewis, Harry Reese</creatorcontrib><title>Substrate defect detection mechanism</title><subject>CORRECTION OF TYPOGRAPHICAL ERRORS</subject><subject>i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>LINING MACHINES</subject><subject>MEASURING</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>PRINTING</subject><subject>SELECTIVE PRINTING MECHANISMS</subject><subject>STAMPS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><subject>TYPEWRITERS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAJLk0qLilKLElVSElNS00uAVIlQCozP08hNzU5IzEvsziXh4E1LTGnOJUXSnMzKLi5hjh76KYW5MenFhckJqfmpZbEuwYYWZhYWBoZOhkaE6EEAOGZJrU</recordid><startdate>20170412</startdate><enddate>20170412</enddate><creator>Walker, Casey Ethan</creator><creator>Johnson, Scott Richard</creator><creator>Lewis, Harry Reese</creator><scope>EVB</scope></search><sort><creationdate>20170412</creationdate><title>Substrate defect detection mechanism</title><author>Walker, Casey Ethan ; Johnson, Scott Richard ; Lewis, Harry Reese</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2848921B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2017</creationdate><topic>CORRECTION OF TYPOGRAPHICAL ERRORS</topic><topic>i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>LINING MACHINES</topic><topic>MEASURING</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>PRINTING</topic><topic>SELECTIVE PRINTING MECHANISMS</topic><topic>STAMPS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><topic>TYPEWRITERS</topic><toplevel>online_resources</toplevel><creatorcontrib>Walker, Casey Ethan</creatorcontrib><creatorcontrib>Johnson, Scott Richard</creatorcontrib><creatorcontrib>Lewis, Harry Reese</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Walker, Casey Ethan</au><au>Johnson, Scott Richard</au><au>Lewis, Harry Reese</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Substrate defect detection mechanism</title><date>2017-04-12</date><risdate>2017</risdate><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre ; ger |
| recordid | cdi_epo_espacenet_EP2848921B1 |
| source | esp@cenet |
| subjects | CORRECTION OF TYPOGRAPHICAL ERRORS i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES LINING MACHINES MEASURING PERFORMING OPERATIONS PHYSICS PRINTING SELECTIVE PRINTING MECHANISMS STAMPS TESTING TRANSPORTING TYPEWRITERS |
| title | Substrate defect detection mechanism |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-20T18%3A46%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Walker,%20Casey%20Ethan&rft.date=2017-04-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2848921B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |