NORMAL DETECTION METHOD, NORMAL DETECTION DEVICE, AND MACHINING MACHINE PROVIDED WITH NORMAL DETECTION FUNCTION
A normal detection method for measuring the distance to a measurement subject (20) using one or more distance detectors (30), and obtaining a normal vector (Vn) on the measured surface (21) of the measurement subject (20) from the obtained measurement result (L), wherein: within a three-dimensional...
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| creator | NAKAMURA Mikio IENAGA Hirofumi FUJITA Yoshihito |
| description | A normal detection method for measuring the distance to a measurement subject (20) using one or more distance detectors (30), and obtaining a normal vector (Vn) on the measured surface (21) of the measurement subject (20) from the obtained measurement result (L), wherein: within a three-dimensional space, the straight line linking a first measurement point (Qa) measured at a first measurement position (Pa) using the distance detector (30) and a second measurement point (Qd) measured at a second measurement position (Pd) different from the first measurement position (Pa) is set as a first vector (Vad); the straight line linking the first measurement point (Qa) and a third measurement point (Qf) measured at a third measurement position (Pf) different from the first measurement position (Pa) and the second measurement position (Pd) as a second vector (Vaf); and a normal vector (Vn) on the measured surface (21) is obtained by determining the vector product of the first vector (Vad) and the second vector (Vaf). |
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the straight line linking the first measurement point (Qa) and a third measurement point (Qf) measured at a third measurement position (Pf) different from the first measurement position (Pa) and the second measurement position (Pd) as a second vector (Vaf); and a normal vector (Vn) on the measured surface (21) is obtained by determining the vector product of the first vector (Vad) and the second vector (Vaf).</description><language>eng ; fre ; ger</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190904&DB=EPODOC&CC=EP&NR=2827098B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190904&DB=EPODOC&CC=EP&NR=2827098B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAKAMURA Mikio</creatorcontrib><creatorcontrib>IENAGA Hirofumi</creatorcontrib><creatorcontrib>FUJITA Yoshihito</creatorcontrib><title>NORMAL DETECTION METHOD, NORMAL DETECTION DEVICE, AND MACHINING MACHINE PROVIDED WITH NORMAL DETECTION FUNCTION</title><description>A normal detection method for measuring the distance to a measurement subject (20) using one or more distance detectors (30), and obtaining a normal vector (Vn) on the measured surface (21) of the measurement subject (20) from the obtained measurement result (L), wherein: within a three-dimensional space, the straight line linking a first measurement point (Qa) measured at a first measurement position (Pa) using the distance detector (30) and a second measurement point (Qd) measured at a second measurement position (Pd) different from the first measurement position (Pa) is set as a first vector (Vad); 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IENAGA Hirofumi ; FUJITA Yoshihito</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2827098B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2019</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NAKAMURA Mikio</creatorcontrib><creatorcontrib>IENAGA Hirofumi</creatorcontrib><creatorcontrib>FUJITA Yoshihito</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAKAMURA Mikio</au><au>IENAGA Hirofumi</au><au>FUJITA Yoshihito</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>NORMAL DETECTION METHOD, NORMAL DETECTION DEVICE, AND MACHINING MACHINE PROVIDED WITH NORMAL DETECTION FUNCTION</title><date>2019-09-04</date><risdate>2019</risdate><abstract>A normal detection method for measuring the distance to a measurement subject (20) using one or more distance detectors (30), and obtaining a normal vector (Vn) on the measured surface (21) of the measurement subject (20) from the obtained measurement result (L), wherein: within a three-dimensional space, the straight line linking a first measurement point (Qa) measured at a first measurement position (Pa) using the distance detector (30) and a second measurement point (Qd) measured at a second measurement position (Pd) different from the first measurement position (Pa) is set as a first vector (Vad); the straight line linking the first measurement point (Qa) and a third measurement point (Qf) measured at a third measurement position (Pf) different from the first measurement position (Pa) and the second measurement position (Pd) as a second vector (Vaf); and a normal vector (Vn) on the measured surface (21) is obtained by determining the vector product of the first vector (Vad) and the second vector (Vaf).</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | NORMAL DETECTION METHOD, NORMAL DETECTION DEVICE, AND MACHINING MACHINE PROVIDED WITH NORMAL DETECTION FUNCTION |
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