THIN SECTION PREPARATION DEVICE AND THIN SECTION PREPARATION METHOD
A thin section fabrication apparatus includes an epi-imaging data acquisition unit that performs imaging by radiating epi-illumination and acquires imaging data, a diffusion imaging data acquisition unit that performs imaging by radiating diffusion illumination and acquires imaging data, an exposed...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre ; ger |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | ITO Tetsumasa |
| description | A thin section fabrication apparatus includes an epi-imaging data acquisition unit that performs imaging by radiating epi-illumination and acquires imaging data, a diffusion imaging data acquisition unit that performs imaging by radiating diffusion illumination and acquires imaging data, an exposed shape extraction unit that extracts an exposed shape of an exposure portion of the biological sample which is exposed to a surface of the embedding block, based on the imaging data acquired by the epi-imaging data acquisition unit, an embedded shape extraction unit that extracts an embedded shape of an embedding portion of the biological sample which is embedded in the embedding block, based on the imaging data acquired by the diffusion imaging data acquisition unit, and a control unit that determines ending of the preliminary cutting by comparing the exposed shape extracted by the exposed shape extraction unit and the embedded shape extracted by the embedded shape extraction unit. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2813833B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2813833B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2813833B13</originalsourceid><addsrcrecordid>eNrjZHAO8fD0Uwh2dQ7x9PdTCAhyDXAMcgSzXVzDPJ1dFRz9XBRwqvF1DfHwd-FhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuAUYWhsYWxsZOhsZEKAEA38QrKg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>THIN SECTION PREPARATION DEVICE AND THIN SECTION PREPARATION METHOD</title><source>esp@cenet</source><creator>ITO Tetsumasa</creator><creatorcontrib>ITO Tetsumasa</creatorcontrib><description>A thin section fabrication apparatus includes an epi-imaging data acquisition unit that performs imaging by radiating epi-illumination and acquires imaging data, a diffusion imaging data acquisition unit that performs imaging by radiating diffusion illumination and acquires imaging data, an exposed shape extraction unit that extracts an exposed shape of an exposure portion of the biological sample which is exposed to a surface of the embedding block, based on the imaging data acquired by the epi-imaging data acquisition unit, an embedded shape extraction unit that extracts an embedded shape of an embedding portion of the biological sample which is embedded in the embedding block, based on the imaging data acquired by the diffusion imaging data acquisition unit, and a control unit that determines ending of the preliminary cutting by comparing the exposed shape extracted by the exposed shape extraction unit and the embedded shape extracted by the embedded shape extraction unit.</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180411&DB=EPODOC&CC=EP&NR=2813833B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180411&DB=EPODOC&CC=EP&NR=2813833B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ITO Tetsumasa</creatorcontrib><title>THIN SECTION PREPARATION DEVICE AND THIN SECTION PREPARATION METHOD</title><description>A thin section fabrication apparatus includes an epi-imaging data acquisition unit that performs imaging by radiating epi-illumination and acquires imaging data, a diffusion imaging data acquisition unit that performs imaging by radiating diffusion illumination and acquires imaging data, an exposed shape extraction unit that extracts an exposed shape of an exposure portion of the biological sample which is exposed to a surface of the embedding block, based on the imaging data acquired by the epi-imaging data acquisition unit, an embedded shape extraction unit that extracts an embedded shape of an embedding portion of the biological sample which is embedded in the embedding block, based on the imaging data acquired by the diffusion imaging data acquisition unit, and a control unit that determines ending of the preliminary cutting by comparing the exposed shape extracted by the exposed shape extraction unit and the embedded shape extracted by the embedded shape extraction unit.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAO8fD0Uwh2dQ7x9PdTCAhyDXAMcgSzXVzDPJ1dFRz9XBRwqvF1DfHwd-FhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuAUYWhsYWxsZOhsZEKAEA38QrKg</recordid><startdate>20180411</startdate><enddate>20180411</enddate><creator>ITO Tetsumasa</creator><scope>EVB</scope></search><sort><creationdate>20180411</creationdate><title>THIN SECTION PREPARATION DEVICE AND THIN SECTION PREPARATION METHOD</title><author>ITO Tetsumasa</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2813833B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2018</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ITO Tetsumasa</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ITO Tetsumasa</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>THIN SECTION PREPARATION DEVICE AND THIN SECTION PREPARATION METHOD</title><date>2018-04-11</date><risdate>2018</risdate><abstract>A thin section fabrication apparatus includes an epi-imaging data acquisition unit that performs imaging by radiating epi-illumination and acquires imaging data, a diffusion imaging data acquisition unit that performs imaging by radiating diffusion illumination and acquires imaging data, an exposed shape extraction unit that extracts an exposed shape of an exposure portion of the biological sample which is exposed to a surface of the embedding block, based on the imaging data acquired by the epi-imaging data acquisition unit, an embedded shape extraction unit that extracts an embedded shape of an embedding portion of the biological sample which is embedded in the embedding block, based on the imaging data acquired by the diffusion imaging data acquisition unit, and a control unit that determines ending of the preliminary cutting by comparing the exposed shape extracted by the exposed shape extraction unit and the embedded shape extracted by the embedded shape extraction unit.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre ; ger |
| recordid | cdi_epo_espacenet_EP2813833B1 |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | THIN SECTION PREPARATION DEVICE AND THIN SECTION PREPARATION METHOD |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T14%3A10%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ITO%20Tetsumasa&rft.date=2018-04-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2813833B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |