METHOD AND DEVICE FOR CHARACTERISING A MATERIAL BY ELECTROMAGNETIC RADIATION SCATTERING

The invention relates to a device for identifying a material of an object having: a source of X photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after diffusion in a vol...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	PAULUS, Caroline, TABARY, Joachim
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!