SUB-MILLINEWTON CAPACITIVE MEMS FORCE SENSOR FOR MECHANICAL TESTING ON A MICROSCOPE

Most mechanical tests (compression testing, tensile testing, flexure testing, shear testing) of samples in the sub-mm size scale are performed under the observation with an optical microscope or a scanning electron microscope. However, the following problems exist with prior art force sensors as e.g...

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Bibliographische Detailangaben
Hauptverfasser: DIETZE, WOLFGANG, MUNTWYLER, SIMON, BEYELER, FELIX
Format: Patent
Sprache:eng ; fre ; ger
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