MICROSCOPY INSTRUMENTS WITH DETECTOR ARRAYS AND BEAM SPLITTING SYSTEM

Microscopy instruments with detectors located on one side of the instruments are disclosed. The microscopy instruments include a splitting system and an array of detectors disposed on one side of the instrument. A beam composed of two or more separate emission channels is separated by the splitting...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CURTS, Kyle, Justin, COOPER, Jeremy, R
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING
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