MICROSCOPY INSTRUMENTS WITH DETECTOR ARRAYS AND BEAM SPLITTING SYSTEM

MICROSCOPY INSTRUMENTS WITH DETECTOR ARRAYS AND BEAM SPLITTING SYSTEM

Microscopy instruments with detectors located on one side of the instruments are disclosed. The microscopy instruments include a splitting system and an array of detectors disposed on one side of the instrument. A beam composed of two or more separate emission channels is separated by the splitting...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: CURTS, Kyle, Justin, COOPER, Jeremy, R
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator CURTS, Kyle, Justin
COOPER, Jeremy, R
description Microscopy instruments with detectors located on one side of the instruments are disclosed. The microscopy instruments include a splitting system and an array of detectors disposed on one side of the instrument. A beam composed of two or more separate emission channels is separated by the splitting system into two or more beams that travel along separate paths so that each beam reaches a different detector in the array of detectors. Each beam is a different emission channel and the beams are substantially parallel.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2742382B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2742382B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2742382B13</originalsourceid><addsrcrecordid>eNqNyjsKwkAQANBtLES9w1zAwo2g7WYzmgH3w86IbBWCjJVoIN4fGw9g9Zq3NBjIl8Q-5QoUWco1YBSGG0kPHQp6SQVcKa4yuNhBiy4A5wuJUDwDVxYMa7N4jM9ZNz9XBk4ovt_q9B50nsa7vvQzYLaHvW2Ott01f5QveFosNQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MICROSCOPY INSTRUMENTS WITH DETECTOR ARRAYS AND BEAM SPLITTING SYSTEM</title><source>esp@cenet</source><creator>CURTS, Kyle, Justin ; COOPER, Jeremy, R</creator><creatorcontrib>CURTS, Kyle, Justin ; COOPER, Jeremy, R</creatorcontrib><description>Microscopy instruments with detectors located on one side of the instruments are disclosed. The microscopy instruments include a splitting system and an array of detectors disposed on one side of the instrument. A beam composed of two or more separate emission channels is separated by the splitting system into two or more beams that travel along separate paths so that each beam reaches a different detector in the array of detectors. Each beam is a different emission channel and the beams are substantially parallel.</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180418&amp;DB=EPODOC&amp;CC=EP&amp;NR=2742382B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180418&amp;DB=EPODOC&amp;CC=EP&amp;NR=2742382B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CURTS, Kyle, Justin</creatorcontrib><creatorcontrib>COOPER, Jeremy, R</creatorcontrib><title>MICROSCOPY INSTRUMENTS WITH DETECTOR ARRAYS AND BEAM SPLITTING SYSTEM</title><description>Microscopy instruments with detectors located on one side of the instruments are disclosed. The microscopy instruments include a splitting system and an array of detectors disposed on one side of the instrument. A beam composed of two or more separate emission channels is separated by the splitting system into two or more beams that travel along separate paths so that each beam reaches a different detector in the array of detectors. Each beam is a different emission channel and the beams are substantially parallel.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjsKwkAQANBtLES9w1zAwo2g7WYzmgH3w86IbBWCjJVoIN4fGw9g9Zq3NBjIl8Q-5QoUWco1YBSGG0kPHQp6SQVcKa4yuNhBiy4A5wuJUDwDVxYMa7N4jM9ZNz9XBk4ovt_q9B50nsa7vvQzYLaHvW2Ott01f5QveFosNQ</recordid><startdate>20180418</startdate><enddate>20180418</enddate><creator>CURTS, Kyle, Justin</creator><creator>COOPER, Jeremy, R</creator><scope>EVB</scope></search><sort><creationdate>20180418</creationdate><title>MICROSCOPY INSTRUMENTS WITH DETECTOR ARRAYS AND BEAM SPLITTING SYSTEM</title><author>CURTS, Kyle, Justin ; COOPER, Jeremy, R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2742382B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2018</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CURTS, Kyle, Justin</creatorcontrib><creatorcontrib>COOPER, Jeremy, R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CURTS, Kyle, Justin</au><au>COOPER, Jeremy, R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MICROSCOPY INSTRUMENTS WITH DETECTOR ARRAYS AND BEAM SPLITTING SYSTEM</title><date>2018-04-18</date><risdate>2018</risdate><abstract>Microscopy instruments with detectors located on one side of the instruments are disclosed. The microscopy instruments include a splitting system and an array of detectors disposed on one side of the instrument. A beam composed of two or more separate emission channels is separated by the splitting system into two or more beams that travel along separate paths so that each beam reaches a different detector in the array of detectors. Each beam is a different emission channel and the beams are substantially parallel.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP2742382B1
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
title MICROSCOPY INSTRUMENTS WITH DETECTOR ARRAYS AND BEAM SPLITTING SYSTEM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T00%3A58%3A46IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CURTS,%20Kyle,%20Justin&rft.date=2018-04-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2742382B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true