ELECTRON DETECTOR INCLUDING ONE OR MORE INTIMATELY-COUPLED SCINTILLATOR-PHOTOMULTIPLIER COMBINATIONS, AND ELECTRON MICROSCOPE EMPLOYING SAME
An electron detector includes a plurality of assemblies, the plurality of assemblies including a first assembly having a first SiPM and a first scintillator made of a first scintillator material directly connected to an active light sensing surface of the first SiPM, and a second assembly having a s...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre ; ger |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | MOTT, RICHARD B BARBI, NICHOLAS C |
| description | An electron detector includes a plurality of assemblies, the plurality of assemblies including a first assembly having a first SiPM and a first scintillator made of a first scintillator material directly connected to an active light sensing surface of the first SiPM, and a second assembly having a second SiPM and a second scintillator made of a second scintillator material directly connected to an active light sensing surface of the second SiPM, wherein the first scintillator material and the second scintillator material are different than one another. Alternatively, an electron detector includes an assembly including an SiPM and a scintillator member having a front surface and a back surface, the scintillator member being a film of a scintillator material directly deposited on to an active light sensing surface of the SiPM. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2739958B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2739958B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2739958B13</originalsourceid><addsrcrecordid>eNqNjbEKwjAURbs4iPoP7wPsoEW0Y5o-beAlLyTp0KkUiZNooX6GH20K4ux0L4d7OcvsjYQyODZQY0iNHSgjqa2VuQAbhAQ0O0w0KC0CUpdLbi1hDV7OkEikV24bDqxbCsqSQgeSdaWMCIqN34IwNfxMWknHXrJFQG2Ju9nlhcZ1trgN9yluvrnK4IxBNnkcn32cxuEaH_HVo90fi7I8nKpd8cfkA2TYQBo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ELECTRON DETECTOR INCLUDING ONE OR MORE INTIMATELY-COUPLED SCINTILLATOR-PHOTOMULTIPLIER COMBINATIONS, AND ELECTRON MICROSCOPE EMPLOYING SAME</title><source>esp@cenet</source><creator>MOTT, RICHARD B ; BARBI, NICHOLAS C</creator><creatorcontrib>MOTT, RICHARD B ; BARBI, NICHOLAS C</creatorcontrib><description>An electron detector includes a plurality of assemblies, the plurality of assemblies including a first assembly having a first SiPM and a first scintillator made of a first scintillator material directly connected to an active light sensing surface of the first SiPM, and a second assembly having a second SiPM and a second scintillator made of a second scintillator material directly connected to an active light sensing surface of the second SiPM, wherein the first scintillator material and the second scintillator material are different than one another. Alternatively, an electron detector includes an assembly including an SiPM and a scintillator member having a front surface and a back surface, the scintillator member being a film of a scintillator material directly deposited on to an active light sensing surface of the SiPM.</description><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; MEASUREMENT OF NUCLEAR OR X-RADIATION ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160120&DB=EPODOC&CC=EP&NR=2739958B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160120&DB=EPODOC&CC=EP&NR=2739958B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MOTT, RICHARD B</creatorcontrib><creatorcontrib>BARBI, NICHOLAS C</creatorcontrib><title>ELECTRON DETECTOR INCLUDING ONE OR MORE INTIMATELY-COUPLED SCINTILLATOR-PHOTOMULTIPLIER COMBINATIONS, AND ELECTRON MICROSCOPE EMPLOYING SAME</title><description>An electron detector includes a plurality of assemblies, the plurality of assemblies including a first assembly having a first SiPM and a first scintillator made of a first scintillator material directly connected to an active light sensing surface of the first SiPM, and a second assembly having a second SiPM and a second scintillator made of a second scintillator material directly connected to an active light sensing surface of the second SiPM, wherein the first scintillator material and the second scintillator material are different than one another. Alternatively, an electron detector includes an assembly including an SiPM and a scintillator member having a front surface and a back surface, the scintillator member being a film of a scintillator material directly deposited on to an active light sensing surface of the SiPM.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjbEKwjAURbs4iPoP7wPsoEW0Y5o-beAlLyTp0KkUiZNooX6GH20K4ux0L4d7OcvsjYQyODZQY0iNHSgjqa2VuQAbhAQ0O0w0KC0CUpdLbi1hDV7OkEikV24bDqxbCsqSQgeSdaWMCIqN34IwNfxMWknHXrJFQG2Ju9nlhcZ1trgN9yluvrnK4IxBNnkcn32cxuEaH_HVo90fi7I8nKpd8cfkA2TYQBo</recordid><startdate>20160120</startdate><enddate>20160120</enddate><creator>MOTT, RICHARD B</creator><creator>BARBI, NICHOLAS C</creator><scope>EVB</scope></search><sort><creationdate>20160120</creationdate><title>ELECTRON DETECTOR INCLUDING ONE OR MORE INTIMATELY-COUPLED SCINTILLATOR-PHOTOMULTIPLIER COMBINATIONS, AND ELECTRON MICROSCOPE EMPLOYING SAME</title><author>MOTT, RICHARD B ; BARBI, NICHOLAS C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2739958B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2016</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MOTT, RICHARD B</creatorcontrib><creatorcontrib>BARBI, NICHOLAS C</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MOTT, RICHARD B</au><au>BARBI, NICHOLAS C</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ELECTRON DETECTOR INCLUDING ONE OR MORE INTIMATELY-COUPLED SCINTILLATOR-PHOTOMULTIPLIER COMBINATIONS, AND ELECTRON MICROSCOPE EMPLOYING SAME</title><date>2016-01-20</date><risdate>2016</risdate><abstract>An electron detector includes a plurality of assemblies, the plurality of assemblies including a first assembly having a first SiPM and a first scintillator made of a first scintillator material directly connected to an active light sensing surface of the first SiPM, and a second assembly having a second SiPM and a second scintillator made of a second scintillator material directly connected to an active light sensing surface of the second SiPM, wherein the first scintillator material and the second scintillator material are different than one another. Alternatively, an electron detector includes an assembly including an SiPM and a scintillator member having a front surface and a back surface, the scintillator member being a film of a scintillator material directly deposited on to an active light sensing surface of the SiPM.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre ; ger |
| recordid | cdi_epo_espacenet_EP2739958B1 |
| source | esp@cenet |
| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING |
| title | ELECTRON DETECTOR INCLUDING ONE OR MORE INTIMATELY-COUPLED SCINTILLATOR-PHOTOMULTIPLIER COMBINATIONS, AND ELECTRON MICROSCOPE EMPLOYING SAME |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T15%3A23%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MOTT,%20RICHARD%20B&rft.date=2016-01-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2739958B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |