Absolute position measuring device
The device (1) has a first subassembly including a measuring standard i.e. scale, on which a code track is placed, and a scanning unit scanning the track in measuring direction to produce position signals to generate absolute digital position. A second subassembly includes a peripheral unit to perfo...
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| creator | BRATZDRUM, ERWIN AUER, DANIEL |
| description | The device (1) has a first subassembly including a measuring standard i.e. scale, on which a code track is placed, and a scanning unit scanning the track in measuring direction to produce position signals to generate absolute digital position. A second subassembly includes a peripheral unit to perform additional and/or auxiliary function of the device. The first subassembly and the second subassembly are connected to each other by a set of electric lines to transmit electrical signals. The first subassembly exclusively includes components used in a radiation area (A) of a machine. An independent claim is also included for a measuring system. |
| format | Patent |
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A second subassembly includes a peripheral unit to perform additional and/or auxiliary function of the device. The first subassembly and the second subassembly are connected to each other by a set of electric lines to transmit electrical signals. The first subassembly exclusively includes components used in a radiation area (A) of a machine. 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| language | eng ; fre ; ger |
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| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS SEMICONDUCTOR DEVICES TARIFF METERING APPARATUS TESTING |
| title | Absolute position measuring device |
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