COMPONENT MEASUREMENT DEVICE

COMPONENT MEASUREMENT DEVICE

The component measuring device is provided with: a photometric block (72) having a mounting portion (87) having an opening so as to be opposed to a test paper (70), and having a reflected light optical path (110) for guiding reflected light (Lr) to a light receiving element (102), the reflected ligh...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: MORITA TAKASHI, NAGASAWA YASUSHI, IZUMI EIKI, NAGAOKA YOSHIO, MURAYAMA MASAMI
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator MORITA TAKASHI
NAGASAWA YASUSHI
IZUMI EIKI
NAGAOKA YOSHIO
MURAYAMA MASAMI
description The component measuring device is provided with: a photometric block (72) having a mounting portion (87) having an opening so as to be opposed to a test paper (70), and having a reflected light optical path (110) for guiding reflected light (Lr) to a light receiving element (102), the reflected light optical path (110) communicating with the mounting portion (87); and a reflected light lens (88b) for condensing the reflected light (Lr) onto the light receiving element (102). The reflected light lens (88b) is formed as an aspheric lens for reducing at least spherical aberration of the reflected light (Lr) on a basis of a position of disposition of the light receiving element (102).
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2690428A4</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2690428A4</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2690428A43</originalsourceid><addsrcrecordid>eNrjZJBx9vcN8Pdz9QtR8HV1DA4NcvUFsV1cwzydXXkYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSbxrgJGZpYGJkYWjiTERSgBEYCCY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>COMPONENT MEASUREMENT DEVICE</title><source>esp@cenet</source><creator>MORITA TAKASHI ; NAGASAWA YASUSHI ; IZUMI EIKI ; NAGAOKA YOSHIO ; MURAYAMA MASAMI</creator><creatorcontrib>MORITA TAKASHI ; NAGASAWA YASUSHI ; IZUMI EIKI ; NAGAOKA YOSHIO ; MURAYAMA MASAMI</creatorcontrib><description>The component measuring device is provided with: a photometric block (72) having a mounting portion (87) having an opening so as to be opposed to a test paper (70), and having a reflected light optical path (110) for guiding reflected light (Lr) to a light receiving element (102), the reflected light optical path (110) communicating with the mounting portion (87); and a reflected light lens (88b) for condensing the reflected light (Lr) onto the light receiving element (102). The reflected light lens (88b) is formed as an aspheric lens for reducing at least spherical aberration of the reflected light (Lr) on a basis of a position of disposition of the light receiving element (102).</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20150225&amp;DB=EPODOC&amp;CC=EP&amp;NR=2690428A4$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20150225&amp;DB=EPODOC&amp;CC=EP&amp;NR=2690428A4$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MORITA TAKASHI</creatorcontrib><creatorcontrib>NAGASAWA YASUSHI</creatorcontrib><creatorcontrib>IZUMI EIKI</creatorcontrib><creatorcontrib>NAGAOKA YOSHIO</creatorcontrib><creatorcontrib>MURAYAMA MASAMI</creatorcontrib><title>COMPONENT MEASUREMENT DEVICE</title><description>The component measuring device is provided with: a photometric block (72) having a mounting portion (87) having an opening so as to be opposed to a test paper (70), and having a reflected light optical path (110) for guiding reflected light (Lr) to a light receiving element (102), the reflected light optical path (110) communicating with the mounting portion (87); and a reflected light lens (88b) for condensing the reflected light (Lr) onto the light receiving element (102). The reflected light lens (88b) is formed as an aspheric lens for reducing at least spherical aberration of the reflected light (Lr) on a basis of a position of disposition of the light receiving element (102).</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJBx9vcN8Pdz9QtR8HV1DA4NcvUFsV1cwzydXXkYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSbxrgJGZpYGJkYWjiTERSgBEYCCY</recordid><startdate>20150225</startdate><enddate>20150225</enddate><creator>MORITA TAKASHI</creator><creator>NAGASAWA YASUSHI</creator><creator>IZUMI EIKI</creator><creator>NAGAOKA YOSHIO</creator><creator>MURAYAMA MASAMI</creator><scope>EVB</scope></search><sort><creationdate>20150225</creationdate><title>COMPONENT MEASUREMENT DEVICE</title><author>MORITA TAKASHI ; NAGASAWA YASUSHI ; IZUMI EIKI ; NAGAOKA YOSHIO ; MURAYAMA MASAMI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2690428A43</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2015</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MORITA TAKASHI</creatorcontrib><creatorcontrib>NAGASAWA YASUSHI</creatorcontrib><creatorcontrib>IZUMI EIKI</creatorcontrib><creatorcontrib>NAGAOKA YOSHIO</creatorcontrib><creatorcontrib>MURAYAMA MASAMI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MORITA TAKASHI</au><au>NAGASAWA YASUSHI</au><au>IZUMI EIKI</au><au>NAGAOKA YOSHIO</au><au>MURAYAMA MASAMI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>COMPONENT MEASUREMENT DEVICE</title><date>2015-02-25</date><risdate>2015</risdate><abstract>The component measuring device is provided with: a photometric block (72) having a mounting portion (87) having an opening so as to be opposed to a test paper (70), and having a reflected light optical path (110) for guiding reflected light (Lr) to a light receiving element (102), the reflected light optical path (110) communicating with the mounting portion (87); and a reflected light lens (88b) for condensing the reflected light (Lr) onto the light receiving element (102). The reflected light lens (88b) is formed as an aspheric lens for reducing at least spherical aberration of the reflected light (Lr) on a basis of a position of disposition of the light receiving element (102).</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP2690428A4
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title COMPONENT MEASUREMENT DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T23%3A07%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MORITA%20TAKASHI&rft.date=2015-02-25&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2690428A4%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true