MICROTOME UTILIZING A MOVABLE KNIFE IN A RETARDATION FIELD SCANNING ELECTRON MICROSCOPE AND A RETARDATION FIELD SCANNING ELECTRON MICROSCOPE INCLUDING THE SAME
A microtome for in situ residence within a chamber of a scanning electron microscope (SEM) and a SEM including the microtome is disclosed. The microtome includes a specimen holder for holding a specimen thereon at high voltage to produce a retardation field thereat and a movable knife. The SEM inclu...
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| creator | GALLOWAY, SIMON, ANDREW |
| description | A microtome for in situ residence within a chamber of a scanning electron microscope (SEM) and a SEM including the microtome is disclosed. The microtome includes a specimen holder for holding a specimen thereon at high voltage to produce a retardation field thereat and a movable knife. The SEM includes a backscatter electron detector disposed adjacent to specimen holder. The knife arranged is to be carried into engagement with the specimen on the specimen holder to slice a portion of the specimen away to expose a new face of the specimen without interfering with the high voltage on the specimen, and is mounted so that after having engaged the specimen to expose a new face of the specimen it is withdrawn to a retracted position whereupon it does not interfere with the retardation field. |
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The knife arranged is to be carried into engagement with the specimen on the specimen holder to slice a portion of the specimen away to expose a new face of the specimen without interfering with the high voltage on the specimen, and is mounted so that after having engaged the specimen to expose a new face of the specimen it is withdrawn to a retracted position whereupon it does not interfere with the retardation field.</description><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150422&DB=EPODOC&CC=EP&NR=2681756B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150422&DB=EPODOC&CC=EP&NR=2681756B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>GALLOWAY, SIMON, ANDREW</creatorcontrib><title>MICROTOME UTILIZING A MOVABLE KNIFE IN A RETARDATION FIELD SCANNING ELECTRON MICROSCOPE AND A RETARDATION FIELD SCANNING ELECTRON MICROSCOPE INCLUDING THE SAME</title><description>A microtome for in situ residence within a chamber of a scanning electron microscope (SEM) and a SEM including the microtome is disclosed. 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The knife arranged is to be carried into engagement with the specimen on the specimen holder to slice a portion of the specimen away to expose a new face of the specimen without interfering with the high voltage on the specimen, and is mounted so that after having engaged the specimen to expose a new face of the specimen it is withdrawn to a retracted position whereupon it does not interfere with the retardation field.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqVjDEOwjAQBNNQIOAP9wGKgAi0jn0hJ-wzci4UNFGETIUgUvgPXyVBPACqlWZnd5q8HOngxTuEWsjSmXgPCpw_qdwiHJgKBOIBBRQVjBLyDAWhNVBpxTz6aFFLGPjnrNL-iKDY_D8i1rY2YyslQqUczpPJtb31cfHNWQIFii6XsXs0se_aS7zHZ4PHVbZLt5ssT9c_KG-DWUQM</recordid><startdate>20150422</startdate><enddate>20150422</enddate><creator>GALLOWAY, SIMON, ANDREW</creator><scope>EVB</scope></search><sort><creationdate>20150422</creationdate><title>MICROTOME UTILIZING A MOVABLE KNIFE IN A RETARDATION FIELD SCANNING ELECTRON MICROSCOPE AND A RETARDATION FIELD SCANNING ELECTRON MICROSCOPE INCLUDING THE SAME</title><author>GALLOWAY, SIMON, ANDREW</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2681756B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2015</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>GALLOWAY, SIMON, ANDREW</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>GALLOWAY, SIMON, ANDREW</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MICROTOME UTILIZING A MOVABLE KNIFE IN A RETARDATION FIELD SCANNING ELECTRON MICROSCOPE AND A RETARDATION FIELD SCANNING ELECTRON MICROSCOPE INCLUDING THE SAME</title><date>2015-04-22</date><risdate>2015</risdate><abstract>A microtome for in situ residence within a chamber of a scanning electron microscope (SEM) and a SEM including the microtome is disclosed. The microtome includes a specimen holder for holding a specimen thereon at high voltage to produce a retardation field thereat and a movable knife. The SEM includes a backscatter electron detector disposed adjacent to specimen holder. The knife arranged is to be carried into engagement with the specimen on the specimen holder to slice a portion of the specimen away to expose a new face of the specimen without interfering with the high voltage on the specimen, and is mounted so that after having engaged the specimen to expose a new face of the specimen it is withdrawn to a retracted position whereupon it does not interfere with the retardation field.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre ; ger |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | MICROTOME UTILIZING A MOVABLE KNIFE IN A RETARDATION FIELD SCANNING ELECTRON MICROSCOPE AND A RETARDATION FIELD SCANNING ELECTRON MICROSCOPE INCLUDING THE SAME |
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