MICROTOME UTILIZING A MOVABLE KNIFE IN A RETARDATION FIELD SCANNING ELECTRON MICROSCOPE AND A RETARDATION FIELD SCANNING ELECTRON MICROSCOPE INCLUDING THE SAME

A microtome for in situ residence within a chamber of a scanning electron microscope (SEM) and a SEM including the microtome is disclosed. The microtome includes a specimen holder for holding a specimen thereon at high voltage to produce a retardation field thereat and a movable knife. The SEM inclu...

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Bibliographische Detailangaben

1. Verfasser:	GALLOWAY, SIMON, ANDREW
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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