System and method for sensor adjustment
One aspect provides a system including a sensor adjustment component (440) comprising: a memory device having adjustment information stored therein; signal source capable of producing a signal (401) detectable by a sensor (410) to be adjusted; and one or more processors; wherein the one or more proc...
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| creator | CROOK, DAVID T MOIN, AREEF A |
| description | One aspect provides a system including a sensor adjustment component (440) comprising: a memory device having adjustment information stored therein; signal source capable of producing a signal (401) detectable by a sensor (410) to be adjusted; and one or more processors; wherein the one or more processors are configured to execute program instructions to operate the signal source to produce a predetermined signal pattern detectable by a measurement component of the sensor to be adjusted; and wherein the predetermined signal pattern comprises the adjustment information. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2645067A2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2645067A2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2645067A23</originalsourceid><addsrcrecordid>eNrjZFAPriwuSc1VSMxLUchNLcnIT1FIyy9SKE7NKwZSiSlZpcUlual5JTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrW4IDE5NS-1JN41wMjMxNTAzNzRyJgIJQBbdyet</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>System and method for sensor adjustment</title><source>esp@cenet</source><creator>CROOK, DAVID T ; MOIN, AREEF A</creator><creatorcontrib>CROOK, DAVID T ; MOIN, AREEF A</creatorcontrib><description>One aspect provides a system including a sensor adjustment component (440) comprising: a memory device having adjustment information stored therein; signal source capable of producing a signal (401) detectable by a sensor (410) to be adjusted; and one or more processors; wherein the one or more processors are configured to execute program instructions to operate the signal source to produce a predetermined signal pattern detectable by a measurement component of the sensor to be adjusted; and wherein the predetermined signal pattern comprises the adjustment information.</description><language>eng ; fre ; ger</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20131002&DB=EPODOC&CC=EP&NR=2645067A2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25553,76306</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20131002&DB=EPODOC&CC=EP&NR=2645067A2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CROOK, DAVID T</creatorcontrib><creatorcontrib>MOIN, AREEF A</creatorcontrib><title>System and method for sensor adjustment</title><description>One aspect provides a system including a sensor adjustment component (440) comprising: a memory device having adjustment information stored therein; signal source capable of producing a signal (401) detectable by a sensor (410) to be adjusted; and one or more processors; wherein the one or more processors are configured to execute program instructions to operate the signal source to produce a predetermined signal pattern detectable by a measurement component of the sensor to be adjusted; and wherein the predetermined signal pattern comprises the adjustment information.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAPriwuSc1VSMxLUchNLcnIT1FIyy9SKE7NKwZSiSlZpcUlual5JTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrW4IDE5NS-1JN41wMjMxNTAzNzRyJgIJQBbdyet</recordid><startdate>20131002</startdate><enddate>20131002</enddate><creator>CROOK, DAVID T</creator><creator>MOIN, AREEF A</creator><scope>EVB</scope></search><sort><creationdate>20131002</creationdate><title>System and method for sensor adjustment</title><author>CROOK, DAVID T ; MOIN, AREEF A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2645067A23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2013</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CROOK, DAVID T</creatorcontrib><creatorcontrib>MOIN, AREEF A</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CROOK, DAVID T</au><au>MOIN, AREEF A</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>System and method for sensor adjustment</title><date>2013-10-02</date><risdate>2013</risdate><abstract>One aspect provides a system including a sensor adjustment component (440) comprising: a memory device having adjustment information stored therein; signal source capable of producing a signal (401) detectable by a sensor (410) to be adjusted; and one or more processors; wherein the one or more processors are configured to execute program instructions to operate the signal source to produce a predetermined signal pattern detectable by a measurement component of the sensor to be adjusted; and wherein the predetermined signal pattern comprises the adjustment information.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre ; ger |
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| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
| title | System and method for sensor adjustment |
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