Workpiece positioning method and apparatus

Workpiece positioning method and apparatus

A method of relatively positioning a workpiece and a reference axis comprising effecting relative displacements of the workpiece and the reference axis along orthogonal axes so that an intersection of the reference axis with the workpiece is moved at substantially constant speed along a curvilinear...

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Hauptverfasser: CHUGG, ANDREW, MICHAEL, WARD, JONATHAN, JAMES, MCINTOSH, JAMES, ROBERT
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
TESTING
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creator CHUGG, ANDREW, MICHAEL
WARD, JONATHAN, JAMES
MCINTOSH, JAMES, ROBERT
description A method of relatively positioning a workpiece and a reference axis comprising effecting relative displacements of the workpiece and the reference axis along orthogonal axes so that an intersection of the reference axis with the workpiece is moved at substantially constant speed along a curvilinear path. The method is particularly applicable to SEE sensitivity mapping of a microchip memory using a pulsed laser, relative to the axis of which the chip is moved in a spiral path.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2628061A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2628061A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2628061A13</originalsourceid><addsrcrecordid>eNrjZNAKzy_KLshMTU5VKMgvzizJzM_LzEtXyE0tychPUUjMA-KCgsSixJLSYh4G1rTEnOJUXijNzaDg5hri7KGbWpAfn1pckJicmpdaEu8aYGRmZGFgZuhoaEyEEgARZykM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Workpiece positioning method and apparatus</title><source>esp@cenet</source><creator>CHUGG, ANDREW, MICHAEL ; WARD, JONATHAN, JAMES ; MCINTOSH, JAMES, ROBERT</creator><creatorcontrib>CHUGG, ANDREW, MICHAEL ; WARD, JONATHAN, JAMES ; MCINTOSH, JAMES, ROBERT</creatorcontrib><description>A method of relatively positioning a workpiece and a reference axis comprising effecting relative displacements of the workpiece and the reference axis along orthogonal axes so that an intersection of the reference axis with the workpiece is moved at substantially constant speed along a curvilinear path. The method is particularly applicable to SEE sensitivity mapping of a microchip memory using a pulsed laser, relative to the axis of which the chip is moved in a spiral path.</description><language>eng ; fre ; ger</language><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130821&amp;DB=EPODOC&amp;CC=EP&amp;NR=2628061A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130821&amp;DB=EPODOC&amp;CC=EP&amp;NR=2628061A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHUGG, ANDREW, MICHAEL</creatorcontrib><creatorcontrib>WARD, JONATHAN, JAMES</creatorcontrib><creatorcontrib>MCINTOSH, JAMES, ROBERT</creatorcontrib><title>Workpiece positioning method and apparatus</title><description>A method of relatively positioning a workpiece and a reference axis comprising effecting relative displacements of the workpiece and the reference axis along orthogonal axes so that an intersection of the reference axis with the workpiece is moved at substantially constant speed along a curvilinear path. The method is particularly applicable to SEE sensitivity mapping of a microchip memory using a pulsed laser, relative to the axis of which the chip is moved in a spiral path.</description><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAKzy_KLshMTU5VKMgvzizJzM_LzEtXyE0tychPUUjMA-KCgsSixJLSYh4G1rTEnOJUXijNzaDg5hri7KGbWpAfn1pckJicmpdaEu8aYGRmZGFgZuhoaEyEEgARZykM</recordid><startdate>20130821</startdate><enddate>20130821</enddate><creator>CHUGG, ANDREW, MICHAEL</creator><creator>WARD, JONATHAN, JAMES</creator><creator>MCINTOSH, JAMES, ROBERT</creator><scope>EVB</scope></search><sort><creationdate>20130821</creationdate><title>Workpiece positioning method and apparatus</title><author>CHUGG, ANDREW, MICHAEL ; WARD, JONATHAN, JAMES ; MCINTOSH, JAMES, ROBERT</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2628061A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2013</creationdate><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHUGG, ANDREW, MICHAEL</creatorcontrib><creatorcontrib>WARD, JONATHAN, JAMES</creatorcontrib><creatorcontrib>MCINTOSH, JAMES, ROBERT</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHUGG, ANDREW, MICHAEL</au><au>WARD, JONATHAN, JAMES</au><au>MCINTOSH, JAMES, ROBERT</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Workpiece positioning method and apparatus</title><date>2013-08-21</date><risdate>2013</risdate><abstract>A method of relatively positioning a workpiece and a reference axis comprising effecting relative displacements of the workpiece and the reference axis along orthogonal axes so that an intersection of the reference axis with the workpiece is moved at substantially constant speed along a curvilinear path. The method is particularly applicable to SEE sensitivity mapping of a microchip memory using a pulsed laser, relative to the axis of which the chip is moved in a spiral path.</abstract><oa>free_for_read</oa></addata></record>
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subjects CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
TESTING
title Workpiece positioning method and apparatus
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T06%3A02%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHUGG,%20ANDREW,%20MICHAEL&rft.date=2013-08-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2628061A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true