Test data generation
Systems and methods for test data generation are described. In one implementation, the method includes receiving seed data (118-1) having one or more characteristics. Further, the method includes obtaining a selection criterion indicating a selected portion of the seed data (118-1) to be transformed...
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| creator | ROY, ASHIM BABU, NANDITA PATWARDHAN, NIKHIL GIRISH JIVANE, MOKSHA SURYAKANT SANCHETI, EETI |
| description | Systems and methods for test data generation are described. In one implementation, the method includes receiving seed data (118-1) having one or more characteristics. Further, the method includes obtaining a selection criterion indicating a selected portion of the seed data (118-1) to be transformed. Based on the selection criterion, the seed data (118-1) is transformed for at least a plurality of iterations to generate test data (118-2). The test data (118-2) comprise a plurality of data sets including a primary data set (120-1) generated in a first iteration and a secondary data set (120-2) generated in each subsequent iteration. The primary data set (120-1) includes transformed data corresponding to the selected portion of the seed data (118-1) and non-transformed data corresponding to a remaining portion of the seed data (118-1) and each secondary data set (120-2) includes transformed data corresponding to the selected portion of the seed data (118-1). |
| format | Patent |
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| language | eng ; fre ; ger |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | Test data generation |
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