Method for determining a distance and an integrated magnetic field measuring apparatus

The device (10) has a semiconductor body (50) arranged on a metal substrate (70) and comprising a first magnetic field sensor (20) with a sensor signal, a second magnetic field sensor (30) and a current-carrying conductor. A third magnetic field sensor (40) with a sensor signal is formed in the semi...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	HEBERLE, KLAUS
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ELECTRICITY MEASURING MEASURING ANGLES MEASURING AREAS MEASURING ELECTRIC VARIABLES MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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