Sensor devices and methods for use in sensing current through a conductor
Sensor devices and related methods disclosed. One example sensor device (12) includes a Rogowski coil (104) defining an aperture (110) and a dielectric material (108) at least partially enclosing the Rogowski coil. The dielectric material has a dielectric constant of at least about 3.5. The dielectr...
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creator | Bietz, Steven Lee Chamarti, Subramanyam Satyasurya |
description | Sensor devices and related methods disclosed. One example sensor device (12) includes a Rogowski coil (104) defining an aperture (110) and a dielectric material (108) at least partially enclosing the Rogowski coil. The dielectric material has a dielectric constant of at least about 3.5. The dielectric material is configured such that, when a conductor (14) is at least partially inserted within the aperture, at least a portion of the dielectric material is positioned between the Rogowski coil and the conductor. |
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One example sensor device (12) includes a Rogowski coil (104) defining an aperture (110) and a dielectric material (108) at least partially enclosing the Rogowski coil. The dielectric material has a dielectric constant of at least about 3.5. The dielectric material is configured such that, when a conductor (14) is at least partially inserted within the aperture, at least a portion of the dielectric material is positioned between the Rogowski coil and the conductor.</description><language>eng ; fre ; ger</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210414&DB=EPODOC&CC=EP&NR=2568299B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210414&DB=EPODOC&CC=EP&NR=2568299B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Bietz, Steven Lee</creatorcontrib><creatorcontrib>Chamarti, Subramanyam Satyasurya</creatorcontrib><title>Sensor devices and methods for use in sensing current through a conductor</title><description>Sensor devices and related methods disclosed. One example sensor device (12) includes a Rogowski coil (104) defining an aperture (110) and a dielectric material (108) at least partially enclosing the Rogowski coil. The dielectric material has a dielectric constant of at least about 3.5. The dielectric material is configured such that, when a conductor (14) is at least partially inserted within the aperture, at least a portion of the dielectric material is positioned between the Rogowski coil and the conductor.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNykEKwjAQRuFsXIh6h_8CLlpR7LbSojtB9yUk0yagMyWTeH678ACuHjy-tbk9iFUSPH2iI4VljzflIF4xLr8oITJ0UZEnuJIScUYOScoUYOGEfXFZ0tasRvtS2v26Mei75-W6p1kG0tk6YspDd6-Pp3PdNG11-IN8AXgGNGg</recordid><startdate>20210414</startdate><enddate>20210414</enddate><creator>Bietz, Steven Lee</creator><creator>Chamarti, Subramanyam Satyasurya</creator><scope>EVB</scope></search><sort><creationdate>20210414</creationdate><title>Sensor devices and methods for use in sensing current through a conductor</title><author>Bietz, Steven Lee ; Chamarti, Subramanyam Satyasurya</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2568299B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2021</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Bietz, Steven Lee</creatorcontrib><creatorcontrib>Chamarti, Subramanyam Satyasurya</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bietz, Steven Lee</au><au>Chamarti, Subramanyam Satyasurya</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Sensor devices and methods for use in sensing current through a conductor</title><date>2021-04-14</date><risdate>2021</risdate><abstract>Sensor devices and related methods disclosed. One example sensor device (12) includes a Rogowski coil (104) defining an aperture (110) and a dielectric material (108) at least partially enclosing the Rogowski coil. The dielectric material has a dielectric constant of at least about 3.5. The dielectric material is configured such that, when a conductor (14) is at least partially inserted within the aperture, at least a portion of the dielectric material is positioned between the Rogowski coil and the conductor.</abstract><oa>free_for_read</oa></addata></record> |
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title | Sensor devices and methods for use in sensing current through a conductor |
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