Sample processing system and method of processing sample

Sample processing system and method of processing sample

A sample processing system comprising: a transporting device that transports a sample; a plurality of sample processing devices that are arranged along a transport path for the sample transported by the transporting device and configured to process the sample transported by the transporting device b...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Tatsutani, Hiroo
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Tatsutani, Hiroo
description A sample processing system comprising: a transporting device that transports a sample; a plurality of sample processing devices that are arranged along a transport path for the sample transported by the transporting device and configured to process the sample transported by the transporting device based on a processing order; a controller configured to receive a first processing order for the sample and control the transporting device to transport the sample based on the received first processing order, and configured to receive a second processing order for the sample additionally and control the transporting device to transport the sample based on the received second processing order; and a display, wherein the controller is configured to prompt the display to show progress information indicating a progress status of processing the sample with respect to each of the first and second processing orders. A method of processing sample in a sample processing system.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2447701A3</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2447701A3</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2447701A33</originalsourceid><addsrcrecordid>eNrjZLAITswtyElVKCjKT04tLs7MS1coriwuSc1VSMxLUchNLcnIT1HIT0ORB-vgYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxrgFGJibm5gaGjsbGRCgBAM81Lik</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Sample processing system and method of processing sample</title><source>esp@cenet</source><creator>Tatsutani, Hiroo</creator><creatorcontrib>Tatsutani, Hiroo</creatorcontrib><description>A sample processing system comprising: a transporting device that transports a sample; a plurality of sample processing devices that are arranged along a transport path for the sample transported by the transporting device and configured to process the sample transported by the transporting device based on a processing order; a controller configured to receive a first processing order for the sample and control the transporting device to transport the sample based on the received first processing order, and configured to receive a second processing order for the sample additionally and control the transporting device to transport the sample based on the received second processing order; and a display, wherein the controller is configured to prompt the display to show progress information indicating a progress status of processing the sample with respect to each of the first and second processing orders. A method of processing sample in a sample processing system.</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180117&amp;DB=EPODOC&amp;CC=EP&amp;NR=2447701A3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180117&amp;DB=EPODOC&amp;CC=EP&amp;NR=2447701A3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Tatsutani, Hiroo</creatorcontrib><title>Sample processing system and method of processing sample</title><description>A sample processing system comprising: a transporting device that transports a sample; a plurality of sample processing devices that are arranged along a transport path for the sample transported by the transporting device and configured to process the sample transported by the transporting device based on a processing order; a controller configured to receive a first processing order for the sample and control the transporting device to transport the sample based on the received first processing order, and configured to receive a second processing order for the sample additionally and control the transporting device to transport the sample based on the received second processing order; and a display, wherein the controller is configured to prompt the display to show progress information indicating a progress status of processing the sample with respect to each of the first and second processing orders. A method of processing sample in a sample processing system.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAITswtyElVKCjKT04tLs7MS1coriwuSc1VSMxLUchNLcnIT1HIT0ORB-vgYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxrgFGJibm5gaGjsbGRCgBAM81Lik</recordid><startdate>20180117</startdate><enddate>20180117</enddate><creator>Tatsutani, Hiroo</creator><scope>EVB</scope></search><sort><creationdate>20180117</creationdate><title>Sample processing system and method of processing sample</title><author>Tatsutani, Hiroo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2447701A33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2018</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Tatsutani, Hiroo</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tatsutani, Hiroo</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Sample processing system and method of processing sample</title><date>2018-01-17</date><risdate>2018</risdate><abstract>A sample processing system comprising: a transporting device that transports a sample; a plurality of sample processing devices that are arranged along a transport path for the sample transported by the transporting device and configured to process the sample transported by the transporting device based on a processing order; a controller configured to receive a first processing order for the sample and control the transporting device to transport the sample based on the received first processing order, and configured to receive a second processing order for the sample additionally and control the transporting device to transport the sample based on the received second processing order; and a display, wherein the controller is configured to prompt the display to show progress information indicating a progress status of processing the sample with respect to each of the first and second processing orders. A method of processing sample in a sample processing system.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP2447701A3
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Sample processing system and method of processing sample
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T03%3A25%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Tatsutani,%20Hiroo&rft.date=2018-01-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2447701A3%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true