Method for detecting defect in material and system for the method

Bibliographische Detailangaben

Hauptverfasser:	SALAIMEH, AHMAD, DOKI, MASAHIRO, GHARAIBEH, BELAL, NISHIYAMA, TETSUO, BOHUN, SEAN, C, TAKEUCHI, TOMOYA, NAKAGAWA, JUNICHI, ITO, TADAYUKI, SAITO, KOZO, YAMAMOTO, MASAHIRO, ITO, KAZUFUMI, CHUAH, KENG HOO, HUANG, HUAXIONG
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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