SIMULTANEOUS MEASUREMENT OF BEAMS IN LITHOGRAPHY SYSTEM

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1. Verfasser: LOOIJE, Alexius Otto
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2345058A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2345058A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2345058A13</originalsourceid><addsrcrecordid>eNrjZDAP9vQN9Qlx9HP1Dw1W8HV1DA4NcvV19QtR8HdTcHJ19A1W8PRT8PEM8fB3D3IM8IhUCI4MDnH15WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BRsYmpgamFo6GxkQoAQAdAigv</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SIMULTANEOUS MEASUREMENT OF BEAMS IN LITHOGRAPHY SYSTEM</title><source>esp@cenet</source><creator>LOOIJE, Alexius Otto</creator><creatorcontrib>LOOIJE, Alexius Otto</creatorcontrib><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES ; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES ; NANOTECHNOLOGY ; PERFORMING OPERATIONS ; SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES ; TRANSPORTING</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110720&amp;DB=EPODOC&amp;CC=EP&amp;NR=2345058A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110720&amp;DB=EPODOC&amp;CC=EP&amp;NR=2345058A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LOOIJE, Alexius Otto</creatorcontrib><title>SIMULTANEOUS MEASUREMENT OF BEAMS IN LITHOGRAPHY SYSTEM</title><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</subject><subject>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</subject><subject>NANOTECHNOLOGY</subject><subject>PERFORMING OPERATIONS</subject><subject>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAP9vQN9Qlx9HP1Dw1W8HV1DA4NcvV19QtR8HdTcHJ19A1W8PRT8PEM8fB3D3IM8IhUCI4MDnH15WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BRsYmpgamFo6GxkQoAQAdAigv</recordid><startdate>20110720</startdate><enddate>20110720</enddate><creator>LOOIJE, Alexius Otto</creator><scope>EVB</scope></search><sort><creationdate>20110720</creationdate><title>SIMULTANEOUS MEASUREMENT OF BEAMS IN LITHOGRAPHY SYSTEM</title><author>LOOIJE, Alexius Otto</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2345058A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2011</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</topic><topic>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</topic><topic>NANOTECHNOLOGY</topic><topic>PERFORMING OPERATIONS</topic><topic>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LOOIJE, Alexius Otto</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LOOIJE, Alexius Otto</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SIMULTANEOUS MEASUREMENT OF BEAMS IN LITHOGRAPHY SYSTEM</title><date>2011-07-20</date><risdate>2011</risdate><oa>free_for_read</oa></addata></record>
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language eng ; fre ; ger
recordid cdi_epo_espacenet_EP2345058A1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES
NANOTECHNOLOGY
PERFORMING OPERATIONS
SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
TRANSPORTING
title SIMULTANEOUS MEASUREMENT OF BEAMS IN LITHOGRAPHY SYSTEM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T00%3A13%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LOOIJE,%20Alexius%20Otto&rft.date=2011-07-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2345058A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true