APPARATUS FOR TESTING INTEGRATED CIRCUITRY
Gespeichert in:
| Hauptverfasser: | , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre ; ger |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | STACEY, WILLIAM, JOHN MCALPIN, NEIL KOLODKO, JULIAN, PAUL SHEAHAN, JOHN, ROBERT O'DONNELL, ERIC, PATRICK SLEIJPEN, STEPHEN, JOHN EDWARDS, NEIL, FYFE THELANDER, JASON, MARK |
| description | |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2326963A4</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2326963A4</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2326963A43</originalsourceid><addsrcrecordid>eNrjZNByDAhwDHIMCQ1WcPMPUghxDQ7x9HNX8PQLcXUHCru6KDh7BjmHeoYERfIwsKYl5hSn8kJpbgYFN9cQZw_d1IL8-NTigsTk1LzUknjXACNjIzNLM2NHE2MilAAAKaQkmA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>APPARATUS FOR TESTING INTEGRATED CIRCUITRY</title><source>esp@cenet</source><creator>STACEY, WILLIAM, JOHN ; MCALPIN, NEIL ; KOLODKO, JULIAN, PAUL ; SHEAHAN, JOHN, ROBERT ; O'DONNELL, ERIC, PATRICK ; SLEIJPEN, STEPHEN, JOHN ; EDWARDS, NEIL, FYFE ; THELANDER, JASON, MARK</creator><creatorcontrib>STACEY, WILLIAM, JOHN ; MCALPIN, NEIL ; KOLODKO, JULIAN, PAUL ; SHEAHAN, JOHN, ROBERT ; O'DONNELL, ERIC, PATRICK ; SLEIJPEN, STEPHEN, JOHN ; EDWARDS, NEIL, FYFE ; THELANDER, JASON, MARK</creatorcontrib><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; CORRECTION OF TYPOGRAPHICAL ERRORS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME ; LINING MACHINES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PERFORMING OPERATIONS ; PHYSICS ; PRINTING ; SELECTIVE PRINTING MECHANISMS ; SEMICONDUCTOR DEVICES ; STAMPS ; TESTING ; TRANSPORTING ; TYPEWRITERS</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140122&DB=EPODOC&CC=EP&NR=2326963A4$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140122&DB=EPODOC&CC=EP&NR=2326963A4$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>STACEY, WILLIAM, JOHN</creatorcontrib><creatorcontrib>MCALPIN, NEIL</creatorcontrib><creatorcontrib>KOLODKO, JULIAN, PAUL</creatorcontrib><creatorcontrib>SHEAHAN, JOHN, ROBERT</creatorcontrib><creatorcontrib>O'DONNELL, ERIC, PATRICK</creatorcontrib><creatorcontrib>SLEIJPEN, STEPHEN, JOHN</creatorcontrib><creatorcontrib>EDWARDS, NEIL, FYFE</creatorcontrib><creatorcontrib>THELANDER, JASON, MARK</creatorcontrib><title>APPARATUS FOR TESTING INTEGRATED CIRCUITRY</title><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CORRECTION OF TYPOGRAPHICAL ERRORS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME</subject><subject>LINING MACHINES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>PRINTING</subject><subject>SELECTIVE PRINTING MECHANISMS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>STAMPS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><subject>TYPEWRITERS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNByDAhwDHIMCQ1WcPMPUghxDQ7x9HNX8PQLcXUHCru6KDh7BjmHeoYERfIwsKYl5hSn8kJpbgYFN9cQZw_d1IL8-NTigsTk1LzUknjXACNjIzNLM2NHE2MilAAAKaQkmA</recordid><startdate>20140122</startdate><enddate>20140122</enddate><creator>STACEY, WILLIAM, JOHN</creator><creator>MCALPIN, NEIL</creator><creator>KOLODKO, JULIAN, PAUL</creator><creator>SHEAHAN, JOHN, ROBERT</creator><creator>O'DONNELL, ERIC, PATRICK</creator><creator>SLEIJPEN, STEPHEN, JOHN</creator><creator>EDWARDS, NEIL, FYFE</creator><creator>THELANDER, JASON, MARK</creator><scope>EVB</scope></search><sort><creationdate>20140122</creationdate><title>APPARATUS FOR TESTING INTEGRATED CIRCUITRY</title><author>STACEY, WILLIAM, JOHN ; MCALPIN, NEIL ; KOLODKO, JULIAN, PAUL ; SHEAHAN, JOHN, ROBERT ; O'DONNELL, ERIC, PATRICK ; SLEIJPEN, STEPHEN, JOHN ; EDWARDS, NEIL, FYFE ; THELANDER, JASON, MARK</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2326963A43</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2014</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CORRECTION OF TYPOGRAPHICAL ERRORS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME</topic><topic>LINING MACHINES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>PRINTING</topic><topic>SELECTIVE PRINTING MECHANISMS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>STAMPS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><topic>TYPEWRITERS</topic><toplevel>online_resources</toplevel><creatorcontrib>STACEY, WILLIAM, JOHN</creatorcontrib><creatorcontrib>MCALPIN, NEIL</creatorcontrib><creatorcontrib>KOLODKO, JULIAN, PAUL</creatorcontrib><creatorcontrib>SHEAHAN, JOHN, ROBERT</creatorcontrib><creatorcontrib>O'DONNELL, ERIC, PATRICK</creatorcontrib><creatorcontrib>SLEIJPEN, STEPHEN, JOHN</creatorcontrib><creatorcontrib>EDWARDS, NEIL, FYFE</creatorcontrib><creatorcontrib>THELANDER, JASON, MARK</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>STACEY, WILLIAM, JOHN</au><au>MCALPIN, NEIL</au><au>KOLODKO, JULIAN, PAUL</au><au>SHEAHAN, JOHN, ROBERT</au><au>O'DONNELL, ERIC, PATRICK</au><au>SLEIJPEN, STEPHEN, JOHN</au><au>EDWARDS, NEIL, FYFE</au><au>THELANDER, JASON, MARK</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPARATUS FOR TESTING INTEGRATED CIRCUITRY</title><date>2014-01-22</date><risdate>2014</risdate><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre ; ger |
| recordid | cdi_epo_espacenet_EP2326963A4 |
| source | esp@cenet |
| subjects | BASIC ELECTRIC ELEMENTS CORRECTION OF TYPOGRAPHICAL ERRORS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME LINING MACHINES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PERFORMING OPERATIONS PHYSICS PRINTING SELECTIVE PRINTING MECHANISMS SEMICONDUCTOR DEVICES STAMPS TESTING TRANSPORTING TYPEWRITERS |
| title | APPARATUS FOR TESTING INTEGRATED CIRCUITRY |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T18%3A51%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=STACEY,%20WILLIAM,%20JOHN&rft.date=2014-01-22&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2326963A4%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |