Specimen processing apparatus and control method for the same

Specimen processing apparatus and control method for the same

A specimen processing apparatus comprising: a specimen processing section which includes a movable section and processes a specimen by moving the movable section; and a controller for determining whether the movable section was moved while a specimen processing operation by the specimen processing s...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Kurono, Hiroshi, Yamato, Takashi
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CONTROLLING
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
REGULATING
SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
TESTING
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Beschreibung
Zusammenfassung:A specimen processing apparatus comprising: a specimen processing section which includes a movable section and processes a specimen by moving the movable section; and a controller for determining whether the movable section was moved while a specimen processing operation by the specimen processing section was stopped, and controlling the specimen processing section to perform a preparing operation for starting the specimen processing operation based on the determination result, is disclosed. A control method for a specimen processing apparatus is also disclosed.