METHOD AND APPARATUS FOR INSPECTION OF MATERIALS

METHOD AND APPARATUS FOR INSPECTION OF MATERIALS

A method of and apparatus for obtaining radiation transmission data and especially an image of an object in such manner that allows some data about relative proportions of constituent materials to be derived is described. A radiation source and a radiation detector system able to resolve transmitted...

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1. Verfasser: RADLEY, Ian
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
DETECTING MASSES OR OBJECTS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator RADLEY, Ian
description A method of and apparatus for obtaining radiation transmission data and especially an image of an object in such manner that allows some data about relative proportions of constituent materials to be derived is described. A radiation source and a radiation detector system able to resolve transmitted intensity across a plurality of frequencies within the spectrum of the source are used to produce transmitted intensity data for each such frequency. Measured data is compared numerically to a mass attenuation data library storing mass attenuation data, individually or collectively, for a small number of expected constituent component materials to fit each intensity data item to the relationship given by the exponential attenuation law: I/Io=exp[-(mu/rho)rhot] in respect of the constituent component materials and derive therefrom an indication of relative proportions of each constituent component material. An image may be generated from the resolved transmitted intensity data.
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A radiation source and a radiation detector system able to resolve transmitted intensity across a plurality of frequencies within the spectrum of the source are used to produce transmitted intensity data for each such frequency. Measured data is compared numerically to a mass attenuation data library storing mass attenuation data, individually or collectively, for a small number of expected constituent component materials to fit each intensity data item to the relationship given by the exponential attenuation law: I/Io=exp[-(mu/rho)rhot] in respect of the constituent component materials and derive therefrom an indication of relative proportions of each constituent component material. An image may be generated from the resolved transmitted intensity data.</abstract><oa>free_for_read</oa></addata></record>
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language eng ; fre ; ger
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subjects DETECTING MASSES OR OBJECTS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title METHOD AND APPARATUS FOR INSPECTION OF MATERIALS
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