LIGHT SCATTERING MEASUREMENTS USING SIMULTANEOUS DETECTION

LIGHT SCATTERING MEASUREMENTS USING SIMULTANEOUS DETECTION

Methods and apparatus for measuring particle characteristics are disclosed. In one aspect, an amount of light arising from interaction between light and a suspended sample is detected simultaneously with the acquisition of a photon count from a different direction. At least one measure of particle c...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MCNEIL-WATSON, Fraser, MCKNIGHT, David, CONNAH, Malcolm, Trevor, JACK, Robert
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Methods and apparatus for measuring particle characteristics are disclosed. In one aspect, an amount of light arising from interaction between light and a suspended sample is detected simultaneously with the acquisition of a photon count from a different direction. At least one measure of particle characteristics can then be derived based at least in part on timing between information from the steps of acquiring and detecting.