VISUAL EXAMINATION DEVICE AND VISUAL EXAMINATION METHOD
The present invention includes a camera which takes an image of a camera or an inspection target; a device which estimates the movement of the inspection target; a device which generates a high resolution image having a higher resolution than the pixel resolution of a video image taken by the camera...
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| creator | TAKABAYASHI, Junichi OODAKE, Tatsuya SATOH, Yoshinori OCHIAI, Makoto ADACHI, Hiroyuki AIKAWA, Tetsuro YUGUCHI, Yasuhiro |
| description | The present invention includes a camera which takes an image of a camera or an inspection target; a device which estimates the movement of the inspection target; a device which generates a high resolution image having a higher resolution than the pixel resolution of a video image taken by the camera from the video image taken by the camera; a device which evaluates the quality of the high resolution image generated by the generation device; and a device which presents an inspector who visually inspects the inspection target with the high resolution image together with the quality evaluation result of the high resolution image. The present invention can improve the reliability of inspection by use of the high resolution image as well as can reduce the inspection time, and further can guarantee the reliability of the inspection using a high resolution image. |
| format | Patent |
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The present invention can improve the reliability of inspection by use of the high resolution image as well as can reduce the inspection time, and further can guarantee the reliability of the inspection using a high resolution image.</description><language>eng ; fre ; ger</language><subject>CALCULATING ; COMPUTING ; COUNTING ; DECONTAMINATION ARRANGEMENTS THEREFOR ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; NUCLEAR ENGINEERING ; NUCLEAR PHYSICS ; NUCLEAR REACTORS ; PHYSICS ; PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULARRADIATION OR PARTICLE BOMBARDMENT ; TESTING ; TREATING RADIOACTIVELY CONTAMINATED MATERIAL</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180124&DB=EPODOC&CC=EP&NR=2199782B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180124&DB=EPODOC&CC=EP&NR=2199782B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TAKABAYASHI, Junichi</creatorcontrib><creatorcontrib>OODAKE, Tatsuya</creatorcontrib><creatorcontrib>SATOH, Yoshinori</creatorcontrib><creatorcontrib>OCHIAI, Makoto</creatorcontrib><creatorcontrib>ADACHI, Hiroyuki</creatorcontrib><creatorcontrib>AIKAWA, Tetsuro</creatorcontrib><creatorcontrib>YUGUCHI, Yasuhiro</creatorcontrib><title>VISUAL EXAMINATION DEVICE AND VISUAL EXAMINATION METHOD</title><description>The present invention includes a camera which takes an image of a camera or an inspection target; a device which estimates the movement of the inspection target; a device which generates a high resolution image having a higher resolution than the pixel resolution of a video image taken by the camera from the video image taken by the camera; a device which evaluates the quality of the high resolution image generated by the generation device; and a device which presents an inspector who visually inspects the inspection target with the high resolution image together with the quality evaluation result of the high resolution image. 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The present invention can improve the reliability of inspection by use of the high resolution image as well as can reduce the inspection time, and further can guarantee the reliability of the inspection using a high resolution image.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING DECONTAMINATION ARRANGEMENTS THEREFOR IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS NUCLEAR ENGINEERING NUCLEAR PHYSICS NUCLEAR REACTORS PHYSICS PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULARRADIATION OR PARTICLE BOMBARDMENT TESTING TREATING RADIOACTIVELY CONTAMINATED MATERIAL |
| title | VISUAL EXAMINATION DEVICE AND VISUAL EXAMINATION METHOD |
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