PROCESSING ELECTRONICS AND METHOD FOR DETERMINING A COUNT RESULT, AND DETECTOR FOR AN X-RAY IMAGING DEVICE

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	ZEITLER, GUNTER, BAEUMER, CRISTIAN, ENGEL, KLAUS, J, STEADMAN BOOKER, ROGER, HERRMANN, CHRISTOPH
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page
container_issue
container_start_page
container_title
container_volume
creator	ZEITLER, GUNTER BAEUMER, CRISTIAN ENGEL, KLAUS, J STEADMAN BOOKER, ROGER HERRMANN, CHRISTOPH
description
format	Patent
fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2198324B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2198324B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2198324B13</originalsourceid><addsrcrecordid>eNqNy7EOgjAUhWEWB6O-w30AGQAHHevtBZrQlrQXohMhpg7GKAm-f7TGB3A6w_-dZXJrnUXyXpkKqCFkZ41CD8JI0MS1lVBaB5KYnFYmMgFoO8PgyHcNb780duQPjFgYOKVOnEFpUcWHpF4hrZPFdbzPYfPbVQIlMdZpmJ5DmKfxEh7hNVCbZ4d9ke-OWfEHeQP3_jVT</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PROCESSING ELECTRONICS AND METHOD FOR DETERMINING A COUNT RESULT, AND DETECTOR FOR AN X-RAY IMAGING DEVICE</title><source>esp@cenet</source><creator>ZEITLER, GUNTER ; BAEUMER, CRISTIAN ; ENGEL, KLAUS, J ; STEADMAN BOOKER, ROGER ; HERRMANN, CHRISTOPH</creator><creatorcontrib>ZEITLER, GUNTER ; BAEUMER, CRISTIAN ; ENGEL, KLAUS, J ; STEADMAN BOOKER, ROGER ; HERRMANN, CHRISTOPH</creatorcontrib><language>eng ; fre ; ger</language><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160106&DB=EPODOC&CC=EP&NR=2198324B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160106&DB=EPODOC&CC=EP&NR=2198324B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZEITLER, GUNTER</creatorcontrib><creatorcontrib>BAEUMER, CRISTIAN</creatorcontrib><creatorcontrib>ENGEL, KLAUS, J</creatorcontrib><creatorcontrib>STEADMAN BOOKER, ROGER</creatorcontrib><creatorcontrib>HERRMANN, CHRISTOPH</creatorcontrib><title>PROCESSING ELECTRONICS AND METHOD FOR DETERMINING A COUNT RESULT, AND DETECTOR FOR AN X-RAY IMAGING DEVICE</title><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNy7EOgjAUhWEWB6O-w30AGQAHHevtBZrQlrQXohMhpg7GKAm-f7TGB3A6w_-dZXJrnUXyXpkKqCFkZ41CD8JI0MS1lVBaB5KYnFYmMgFoO8PgyHcNb780duQPjFgYOKVOnEFpUcWHpF4hrZPFdbzPYfPbVQIlMdZpmJ5DmKfxEh7hNVCbZ4d9ke-OWfEHeQP3_jVT</recordid><startdate>20160106</startdate><enddate>20160106</enddate><creator>ZEITLER, GUNTER</creator><creator>BAEUMER, CRISTIAN</creator><creator>ENGEL, KLAUS, J</creator><creator>STEADMAN BOOKER, ROGER</creator><creator>HERRMANN, CHRISTOPH</creator><scope>EVB</scope></search><sort><creationdate>20160106</creationdate><title>PROCESSING ELECTRONICS AND METHOD FOR DETERMINING A COUNT RESULT, AND DETECTOR FOR AN X-RAY IMAGING DEVICE</title><author>ZEITLER, GUNTER ; BAEUMER, CRISTIAN ; ENGEL, KLAUS, J ; STEADMAN BOOKER, ROGER ; HERRMANN, CHRISTOPH</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2198324B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2016</creationdate><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZEITLER, GUNTER</creatorcontrib><creatorcontrib>BAEUMER, CRISTIAN</creatorcontrib><creatorcontrib>ENGEL, KLAUS, J</creatorcontrib><creatorcontrib>STEADMAN BOOKER, ROGER</creatorcontrib><creatorcontrib>HERRMANN, CHRISTOPH</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZEITLER, GUNTER</au><au>BAEUMER, CRISTIAN</au><au>ENGEL, KLAUS, J</au><au>STEADMAN BOOKER, ROGER</au><au>HERRMANN, CHRISTOPH</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PROCESSING ELECTRONICS AND METHOD FOR DETERMINING A COUNT RESULT, AND DETECTOR FOR AN X-RAY IMAGING DEVICE</title><date>2016-01-06</date><risdate>2016</risdate><oa>free_for_read</oa></addata></record>
fulltext	fulltext_linktorsrc
identifier
ispartof
issn
language	eng ; fre ; ger
recordid	cdi_epo_espacenet_EP2198324B1
source	esp@cenet
subjects	MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING
title	PROCESSING ELECTRONICS AND METHOD FOR DETERMINING A COUNT RESULT, AND DETECTOR FOR AN X-RAY IMAGING DEVICE
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T15%3A16%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZEITLER,%20GUNTER&rft.date=2016-01-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2198324B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true