SINGLE EVENT UPSET HARDENED STATIC RANDOM ACCESS MEMORY CELL

A single event upset (SEU) hardened memory cell to be utilized in static random access memories is disclosed. The SEU hardened memory cell includes a first transistor, a second transistor and a first resistor connected between a source of the first transistor and a drain of the second transistor. Th...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ROSS, JASON, F, LAWSON, DAVID, C
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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