APPARATUS FOR HARDENING A STATIC RANDOM ACCESS MEMORY CELL FROM SINGLE EVENT UPSETS

APPARATUS FOR HARDENING A STATIC RANDOM ACCESS MEMORY CELL FROM SINGLE EVENT UPSETS

A single event upset (SEU) hardened memory cell to be utilized in static random access memories is disclosed. The SEU hardened memory cell includes a first inverter and a second inverter connected to each other in a cross-coupled manner. The SEU hardened memory cell also includes a first resistor, a...

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Hauptverfasser: ROSS, JASON, F, LAWSON, DAVID, C
Format: Patent
Sprache:eng ; fre ; ger
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INFORMATION STORAGE
PHYSICS
STATIC STORES
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LAWSON, DAVID, C
description A single event upset (SEU) hardened memory cell to be utilized in static random access memories is disclosed. The SEU hardened memory cell includes a first inverter and a second inverter connected to each other in a cross-coupled manner. The SEU hardened memory cell also includes a first resistor, a second resistor and a capacitor. The first resistor is connected between an input of the first inverter and an output of the second inverter. The second resistor is connected between an input of the second inverter and an output of the first inverter. The capacitor is connected between an input of the first inverter and an input of the second inverter.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2115746A2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2115746A2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2115746A23</originalsourceid><addsrcrecordid>eNqNyjsKwkAQgOFtLES9w1zAIvFVD5tZE8g-mJkErEKQtRINxPtjCg9g9cPPtzaCKSGjdgIuMtTIFYUmXAFBFLWxwBiq6AGtJRHw5CPfwFLbguPly4JbAuopKHRJSGVrVo_xOefdrxsDjtTW-zy9hzxP4z2_8megVBbF6XI8Y3n4g3wBi24vUQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>APPARATUS FOR HARDENING A STATIC RANDOM ACCESS MEMORY CELL FROM SINGLE EVENT UPSETS</title><source>esp@cenet</source><creator>ROSS, JASON, F ; LAWSON, DAVID, C</creator><creatorcontrib>ROSS, JASON, F ; LAWSON, DAVID, C</creatorcontrib><description>A single event upset (SEU) hardened memory cell to be utilized in static random access memories is disclosed. The SEU hardened memory cell includes a first inverter and a second inverter connected to each other in a cross-coupled manner. The SEU hardened memory cell also includes a first resistor, a second resistor and a capacitor. The first resistor is connected between an input of the first inverter and an output of the second inverter. The second resistor is connected between an input of the second inverter and an output of the first inverter. The capacitor is connected between an input of the first inverter and an input of the second inverter.</description><language>eng ; fre ; ger</language><subject>INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20091111&amp;DB=EPODOC&amp;CC=EP&amp;NR=2115746A2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20091111&amp;DB=EPODOC&amp;CC=EP&amp;NR=2115746A2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ROSS, JASON, F</creatorcontrib><creatorcontrib>LAWSON, DAVID, C</creatorcontrib><title>APPARATUS FOR HARDENING A STATIC RANDOM ACCESS MEMORY CELL FROM SINGLE EVENT UPSETS</title><description>A single event upset (SEU) hardened memory cell to be utilized in static random access memories is disclosed. The SEU hardened memory cell includes a first inverter and a second inverter connected to each other in a cross-coupled manner. The SEU hardened memory cell also includes a first resistor, a second resistor and a capacitor. The first resistor is connected between an input of the first inverter and an output of the second inverter. The second resistor is connected between an input of the second inverter and an output of the first inverter. The capacitor is connected between an input of the first inverter and an input of the second inverter.</description><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjsKwkAQgOFtLES9w1zAIvFVD5tZE8g-mJkErEKQtRINxPtjCg9g9cPPtzaCKSGjdgIuMtTIFYUmXAFBFLWxwBiq6AGtJRHw5CPfwFLbguPly4JbAuopKHRJSGVrVo_xOefdrxsDjtTW-zy9hzxP4z2_8megVBbF6XI8Y3n4g3wBi24vUQ</recordid><startdate>20091111</startdate><enddate>20091111</enddate><creator>ROSS, JASON, F</creator><creator>LAWSON, DAVID, C</creator><scope>EVB</scope></search><sort><creationdate>20091111</creationdate><title>APPARATUS FOR HARDENING A STATIC RANDOM ACCESS MEMORY CELL FROM SINGLE EVENT UPSETS</title><author>ROSS, JASON, F ; LAWSON, DAVID, C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2115746A23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2009</creationdate><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>ROSS, JASON, F</creatorcontrib><creatorcontrib>LAWSON, DAVID, C</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ROSS, JASON, F</au><au>LAWSON, DAVID, C</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPARATUS FOR HARDENING A STATIC RANDOM ACCESS MEMORY CELL FROM SINGLE EVENT UPSETS</title><date>2009-11-11</date><risdate>2009</risdate><abstract>A single event upset (SEU) hardened memory cell to be utilized in static random access memories is disclosed. The SEU hardened memory cell includes a first inverter and a second inverter connected to each other in a cross-coupled manner. The SEU hardened memory cell also includes a first resistor, a second resistor and a capacitor. The first resistor is connected between an input of the first inverter and an output of the second inverter. The second resistor is connected between an input of the second inverter and an output of the first inverter. The capacitor is connected between an input of the first inverter and an input of the second inverter.</abstract><oa>free_for_read</oa></addata></record>
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subjects INFORMATION STORAGE
PHYSICS
STATIC STORES
title APPARATUS FOR HARDENING A STATIC RANDOM ACCESS MEMORY CELL FROM SINGLE EVENT UPSETS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T22%3A29%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ROSS,%20JASON,%20F&rft.date=2009-11-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2115746A2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true