METHOD FOR DETERMINING AN INFLUENCING VARIABLE ON THE ECCENTRICITY OF AN ANGLE MEASURING DEVICE

The method involves providing a carrier element with a detector arrangement in optical detector elements (3). A rotary body is provided with pattern elements (6), which are arranged at a pattern center (MZ). The rotary body is arranged opposite to the carrier element at an axis (4) in a rotatable ma...

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Hauptverfasser: SIERCKS, Knut, AEBISCHER, Beat, LIPPUNER, Heinz
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Sprache:eng ; fre ; ger
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creator SIERCKS, Knut
AEBISCHER, Beat
LIPPUNER, Heinz
description The method involves providing a carrier element with a detector arrangement in optical detector elements (3). A rotary body is provided with pattern elements (6), which are arranged at a pattern center (MZ). The rotary body is arranged opposite to the carrier element at an axis (4) in a rotatable manner. Eccentricity of the pattern center is measured relative to a detector center (DZ) of the detector arrangement for different rotary positions. An influencing variable of an eccentricity is separated by the eccentricity measurements by aggregate formation. An independent claim is also included for a computer program-product comprising a program code for executing a method for determining an influencing variable on an eccentricity of a goniometer.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2108105B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2108105B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2108105B13</originalsourceid><addsrcrecordid>eNqNi0EKwjAQRbNxIeod5gJCqwhu0_SnHWgnEtNCV6VIXIkW6v3RgAdw9Xm899dqbBFqV5J1nkoE-JaFpSItxGKbDmIS9tqzLhqQEwo1CMZAgmfDYSBnU66l-voW-tr5dCnRs8FWre7TY4m7324UWQRT7-P8GuMyT7f4jO8Rl0OenfPsVOTHP5IPs6QyQQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD FOR DETERMINING AN INFLUENCING VARIABLE ON THE ECCENTRICITY OF AN ANGLE MEASURING DEVICE</title><source>esp@cenet</source><creator>SIERCKS, Knut ; AEBISCHER, Beat ; LIPPUNER, Heinz</creator><creatorcontrib>SIERCKS, Knut ; AEBISCHER, Beat ; LIPPUNER, Heinz</creatorcontrib><description>The method involves providing a carrier element with a detector arrangement in optical detector elements (3). A rotary body is provided with pattern elements (6), which are arranged at a pattern center (MZ). The rotary body is arranged opposite to the carrier element at an axis (4) in a rotatable manner. Eccentricity of the pattern center is measured relative to a detector center (DZ) of the detector arrangement for different rotary positions. An influencing variable of an eccentricity is separated by the eccentricity measurements by aggregate formation. An independent claim is also included for a computer program-product comprising a program code for executing a method for determining an influencing variable on an eccentricity of a goniometer.</description><language>eng ; fre ; ger</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200520&amp;DB=EPODOC&amp;CC=EP&amp;NR=2108105B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200520&amp;DB=EPODOC&amp;CC=EP&amp;NR=2108105B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SIERCKS, Knut</creatorcontrib><creatorcontrib>AEBISCHER, Beat</creatorcontrib><creatorcontrib>LIPPUNER, Heinz</creatorcontrib><title>METHOD FOR DETERMINING AN INFLUENCING VARIABLE ON THE ECCENTRICITY OF AN ANGLE MEASURING DEVICE</title><description>The method involves providing a carrier element with a detector arrangement in optical detector elements (3). A rotary body is provided with pattern elements (6), which are arranged at a pattern center (MZ). The rotary body is arranged opposite to the carrier element at an axis (4) in a rotatable manner. Eccentricity of the pattern center is measured relative to a detector center (DZ) of the detector arrangement for different rotary positions. An influencing variable of an eccentricity is separated by the eccentricity measurements by aggregate formation. An independent claim is also included for a computer program-product comprising a program code for executing a method for determining an influencing variable on an eccentricity of a goniometer.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi0EKwjAQRbNxIeod5gJCqwhu0_SnHWgnEtNCV6VIXIkW6v3RgAdw9Xm899dqbBFqV5J1nkoE-JaFpSItxGKbDmIS9tqzLhqQEwo1CMZAgmfDYSBnU66l-voW-tr5dCnRs8FWre7TY4m7324UWQRT7-P8GuMyT7f4jO8Rl0OenfPsVOTHP5IPs6QyQQ</recordid><startdate>20200520</startdate><enddate>20200520</enddate><creator>SIERCKS, Knut</creator><creator>AEBISCHER, Beat</creator><creator>LIPPUNER, Heinz</creator><scope>EVB</scope></search><sort><creationdate>20200520</creationdate><title>METHOD FOR DETERMINING AN INFLUENCING VARIABLE ON THE ECCENTRICITY OF AN ANGLE MEASURING DEVICE</title><author>SIERCKS, Knut ; AEBISCHER, Beat ; LIPPUNER, Heinz</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2108105B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2020</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SIERCKS, Knut</creatorcontrib><creatorcontrib>AEBISCHER, Beat</creatorcontrib><creatorcontrib>LIPPUNER, Heinz</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SIERCKS, Knut</au><au>AEBISCHER, Beat</au><au>LIPPUNER, Heinz</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD FOR DETERMINING AN INFLUENCING VARIABLE ON THE ECCENTRICITY OF AN ANGLE MEASURING DEVICE</title><date>2020-05-20</date><risdate>2020</risdate><abstract>The method involves providing a carrier element with a detector arrangement in optical detector elements (3). A rotary body is provided with pattern elements (6), which are arranged at a pattern center (MZ). The rotary body is arranged opposite to the carrier element at an axis (4) in a rotatable manner. Eccentricity of the pattern center is measured relative to a detector center (DZ) of the detector arrangement for different rotary positions. An influencing variable of an eccentricity is separated by the eccentricity measurements by aggregate formation. An independent claim is also included for a computer program-product comprising a program code for executing a method for determining an influencing variable on an eccentricity of a goniometer.</abstract><oa>free_for_read</oa></addata></record>
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language eng ; fre ; ger
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subjects ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
title METHOD FOR DETERMINING AN INFLUENCING VARIABLE ON THE ECCENTRICITY OF AN ANGLE MEASURING DEVICE
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