METHOD FOR DETERMINING AN INFLUENCING VARIABLE ON THE ECCENTRICITY OF AN ANGLE MEASURING DEVICE

The method involves providing a carrier element with a detector arrangement in optical detector elements (3). A rotary body is provided with pattern elements (6), which are arranged at a pattern center (MZ). The rotary body is arranged opposite to the carrier element at an axis (4) in a rotatable ma...

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Bibliographische Detailangaben
Hauptverfasser:	SIERCKS, Knut, AEBISCHER, Beat, LIPPUNER, Heinz
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The method involves providing a carrier element with a detector arrangement in optical detector elements (3). A rotary body is provided with pattern elements (6), which are arranged at a pattern center (MZ). The rotary body is arranged opposite to the carrier element at an axis (4) in a rotatable manner. Eccentricity of the pattern center is measured relative to a detector center (DZ) of the detector arrangement for different rotary positions. An influencing variable of an eccentricity is separated by the eccentricity measurements by aggregate formation. An independent claim is also included for a computer program-product comprising a program code for executing a method for determining an influencing variable on an eccentricity of a goniometer.