Kit, its use and method for calibration of a photoluminescence measuring system
Method for calibrating photoluminescence measuring system (A) (preferably a fluorescence measuring system) comprises measuring a fluorescence spectrum (A1) of fluorescence standards (i) by calibrating (A); computing linking factors (A3) by statistic averaging of sequential partial correcting functio...
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creator | Spieles, Monika Nording, Pierre Schönenberger, Bernhard Hoffmann, Katrin Rurack, Knut Monte, Christian Hoffmann, Angelika Resch-Genger, Ute Pfeifer, Dietmar |
description | Method for calibrating photoluminescence measuring system (A) (preferably a fluorescence measuring system) comprises measuring a fluorescence spectrum (A1) of fluorescence standards (i) by calibrating (A); computing linking factors (A3) by statistic averaging of sequential partial correcting functions; and determining total corrected function for the given spectral region by linking the partial corrected functions, measured depending on (A3). Method for calibrating photoluminescence measuring system (A) (preferably a fluorescence measuring system) comprises measuring a fluorescence spectrum (A1) (J i(lambda )) of majority of fluorescence standards (i) (where (i) is such that their spectrally corrected and normal fluorescence spectrum (A2) (l i(lambda )) together given to a spectral region exhibits a corrected fluorescence band, in which each spectrally sequential fluorescence spectrum exhibits at least a minimum intensity at its intersecting wavelengths (lambda i/i+1)) by calibrating (A); computing linking factors (A3) (alpha i) by statistic averaging of sequential partial correcting functions (F i(lambda )) (which is a quotient formation from the measured (A1) and the appropriate corrected (A2)), where statistic average is given by limited intersecting area (A4) (lambda i/i+1+-delta lambda -OL) around the mutual intersecting wavelength (lambda i/i+1); and determining total corrected function (F(lambda )) for the given spectral region by linking the partial corrected functions (F i(lambda ), measured depending on (A3). An independent claim is also included for a kit (I), for restorable calibration of (A) (preferably a fluorescence measuring system), comprising majority of fluorescence spectrum and corrected fluorescence spectrum of (i) in computer-readable form and/or an indication of an internet side, on which the corrected fluorescence spectrum are retrievable, where (i) is such that their spectrally corrected fluorescence spectrum (A2) together given to a spectral region exhibits in the UV spectral region with lambda of 700 nm fluorescence band of the corrected, in each case spectrally sequential fluorescence spectrum at its intersecting wavelength exhibit a minimum intensity of at least 20% of the respective maximum band intensity, each fluorescence band exhibits a half width (FWHM) and at least 1400 cm ->1>of unstructured, edge-free band process respectively with maximum in the relevant spectral region with a spectral dissolution of 1 nm. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2068141B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2068141B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2068141B13</originalsourceid><addsrcrecordid>eNqNyzEOwjAMQNEsDAi4gw8AEgGEmEFFSAwwsFcmddpISRzF7sDt6cABmP7y_tw87kHXEFRgFALMHSTSgTvwXMFhDO-KGjgDe0AoAyvHMYVM4ig7mjTKWEPuQT6ilJZm5jEKrX5dGLg2r8ttQ4VbkoLTRto2z932eLIHe7b7P8gXu5Y2aw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Kit, its use and method for calibration of a photoluminescence measuring system</title><source>esp@cenet</source><creator>Spieles, Monika ; Nording, Pierre ; Schönenberger, Bernhard ; Hoffmann, Katrin ; Rurack, Knut ; Monte, Christian ; Hoffmann, Angelika ; Resch-Genger, Ute ; Pfeifer, Dietmar</creator><creatorcontrib>Spieles, Monika ; Nording, Pierre ; Schönenberger, Bernhard ; Hoffmann, Katrin ; Rurack, Knut ; Monte, Christian ; Hoffmann, Angelika ; Resch-Genger, Ute ; Pfeifer, Dietmar</creatorcontrib><description>Method for calibrating photoluminescence measuring system (A) (preferably a fluorescence measuring system) comprises measuring a fluorescence spectrum (A1) of fluorescence standards (i) by calibrating (A); computing linking factors (A3) by statistic averaging of sequential partial correcting functions; and determining total corrected function for the given spectral region by linking the partial corrected functions, measured depending on (A3). Method for calibrating photoluminescence measuring system (A) (preferably a fluorescence measuring system) comprises measuring a fluorescence spectrum (A1) (J i(lambda )) of majority of fluorescence standards (i) (where (i) is such that their spectrally corrected and normal fluorescence spectrum (A2) (l i(lambda )) together given to a spectral region exhibits a corrected fluorescence band, in which each spectrally sequential fluorescence spectrum exhibits at least a minimum intensity at its intersecting wavelengths (lambda i/i+1)) by calibrating (A); computing linking factors (A3) (alpha i) by statistic averaging of sequential partial correcting functions (F i(lambda )) (which is a quotient formation from the measured (A1) and the appropriate corrected (A2)), where statistic average is given by limited intersecting area (A4) (lambda i/i+1+-delta lambda -OL) around the mutual intersecting wavelength (lambda i/i+1); and determining total corrected function (F(lambda )) for the given spectral region by linking the partial corrected functions (F i(lambda ), measured depending on (A3). An independent claim is also included for a kit (I), for restorable calibration of (A) (preferably a fluorescence measuring system), comprising majority of fluorescence spectrum and corrected fluorescence spectrum of (i) in computer-readable form and/or an indication of an internet side, on which the corrected fluorescence spectrum are retrievable, where (i) is such that their spectrally corrected fluorescence spectrum (A2) together given to a spectral region exhibits in the UV spectral region with lambda of 700 nm fluorescence band of the corrected, in each case spectrally sequential fluorescence spectrum at its intersecting wavelength exhibit a minimum intensity of at least 20% of the respective maximum band intensity, each fluorescence band exhibits a half width (FWHM) and at least 1400 cm ->1>of unstructured, edge-free band process respectively with maximum in the relevant spectral region with a spectral dissolution of 1 nm.</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200624&DB=EPODOC&CC=EP&NR=2068141B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200624&DB=EPODOC&CC=EP&NR=2068141B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Spieles, Monika</creatorcontrib><creatorcontrib>Nording, Pierre</creatorcontrib><creatorcontrib>Schönenberger, Bernhard</creatorcontrib><creatorcontrib>Hoffmann, Katrin</creatorcontrib><creatorcontrib>Rurack, Knut</creatorcontrib><creatorcontrib>Monte, Christian</creatorcontrib><creatorcontrib>Hoffmann, Angelika</creatorcontrib><creatorcontrib>Resch-Genger, Ute</creatorcontrib><creatorcontrib>Pfeifer, Dietmar</creatorcontrib><title>Kit, its use and method for calibration of a photoluminescence measuring system</title><description>Method for calibrating photoluminescence measuring system (A) (preferably a fluorescence measuring system) comprises measuring a fluorescence spectrum (A1) of fluorescence standards (i) by calibrating (A); computing linking factors (A3) by statistic averaging of sequential partial correcting functions; and determining total corrected function for the given spectral region by linking the partial corrected functions, measured depending on (A3). Method for calibrating photoluminescence measuring system (A) (preferably a fluorescence measuring system) comprises measuring a fluorescence spectrum (A1) (J i(lambda )) of majority of fluorescence standards (i) (where (i) is such that their spectrally corrected and normal fluorescence spectrum (A2) (l i(lambda )) together given to a spectral region exhibits a corrected fluorescence band, in which each spectrally sequential fluorescence spectrum exhibits at least a minimum intensity at its intersecting wavelengths (lambda i/i+1)) by calibrating (A); computing linking factors (A3) (alpha i) by statistic averaging of sequential partial correcting functions (F i(lambda )) (which is a quotient formation from the measured (A1) and the appropriate corrected (A2)), where statistic average is given by limited intersecting area (A4) (lambda i/i+1+-delta lambda -OL) around the mutual intersecting wavelength (lambda i/i+1); and determining total corrected function (F(lambda )) for the given spectral region by linking the partial corrected functions (F i(lambda ), measured depending on (A3). An independent claim is also included for a kit (I), for restorable calibration of (A) (preferably a fluorescence measuring system), comprising majority of fluorescence spectrum and corrected fluorescence spectrum of (i) in computer-readable form and/or an indication of an internet side, on which the corrected fluorescence spectrum are retrievable, where (i) is such that their spectrally corrected fluorescence spectrum (A2) together given to a spectral region exhibits in the UV spectral region with lambda of 700 nm fluorescence band of the corrected, in each case spectrally sequential fluorescence spectrum at its intersecting wavelength exhibit a minimum intensity of at least 20% of the respective maximum band intensity, each fluorescence band exhibits a half width (FWHM) and at least 1400 cm ->1>of unstructured, edge-free band process respectively with maximum in the relevant spectral region with a spectral dissolution of 1 nm.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyzEOwjAMQNEsDAi4gw8AEgGEmEFFSAwwsFcmddpISRzF7sDt6cABmP7y_tw87kHXEFRgFALMHSTSgTvwXMFhDO-KGjgDe0AoAyvHMYVM4ig7mjTKWEPuQT6ilJZm5jEKrX5dGLg2r8ttQ4VbkoLTRto2z932eLIHe7b7P8gXu5Y2aw</recordid><startdate>20200624</startdate><enddate>20200624</enddate><creator>Spieles, Monika</creator><creator>Nording, Pierre</creator><creator>Schönenberger, Bernhard</creator><creator>Hoffmann, Katrin</creator><creator>Rurack, Knut</creator><creator>Monte, Christian</creator><creator>Hoffmann, Angelika</creator><creator>Resch-Genger, Ute</creator><creator>Pfeifer, Dietmar</creator><scope>EVB</scope></search><sort><creationdate>20200624</creationdate><title>Kit, its use and method for calibration of a photoluminescence measuring system</title><author>Spieles, Monika ; Nording, Pierre ; Schönenberger, Bernhard ; Hoffmann, Katrin ; Rurack, Knut ; Monte, Christian ; Hoffmann, Angelika ; Resch-Genger, Ute ; Pfeifer, Dietmar</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2068141B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2020</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Spieles, Monika</creatorcontrib><creatorcontrib>Nording, Pierre</creatorcontrib><creatorcontrib>Schönenberger, Bernhard</creatorcontrib><creatorcontrib>Hoffmann, Katrin</creatorcontrib><creatorcontrib>Rurack, Knut</creatorcontrib><creatorcontrib>Monte, Christian</creatorcontrib><creatorcontrib>Hoffmann, Angelika</creatorcontrib><creatorcontrib>Resch-Genger, Ute</creatorcontrib><creatorcontrib>Pfeifer, Dietmar</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Spieles, Monika</au><au>Nording, Pierre</au><au>Schönenberger, Bernhard</au><au>Hoffmann, Katrin</au><au>Rurack, Knut</au><au>Monte, Christian</au><au>Hoffmann, Angelika</au><au>Resch-Genger, Ute</au><au>Pfeifer, Dietmar</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Kit, its use and method for calibration of a photoluminescence measuring system</title><date>2020-06-24</date><risdate>2020</risdate><abstract>Method for calibrating photoluminescence measuring system (A) (preferably a fluorescence measuring system) comprises measuring a fluorescence spectrum (A1) of fluorescence standards (i) by calibrating (A); computing linking factors (A3) by statistic averaging of sequential partial correcting functions; and determining total corrected function for the given spectral region by linking the partial corrected functions, measured depending on (A3). Method for calibrating photoluminescence measuring system (A) (preferably a fluorescence measuring system) comprises measuring a fluorescence spectrum (A1) (J i(lambda )) of majority of fluorescence standards (i) (where (i) is such that their spectrally corrected and normal fluorescence spectrum (A2) (l i(lambda )) together given to a spectral region exhibits a corrected fluorescence band, in which each spectrally sequential fluorescence spectrum exhibits at least a minimum intensity at its intersecting wavelengths (lambda i/i+1)) by calibrating (A); computing linking factors (A3) (alpha i) by statistic averaging of sequential partial correcting functions (F i(lambda )) (which is a quotient formation from the measured (A1) and the appropriate corrected (A2)), where statistic average is given by limited intersecting area (A4) (lambda i/i+1+-delta lambda -OL) around the mutual intersecting wavelength (lambda i/i+1); and determining total corrected function (F(lambda )) for the given spectral region by linking the partial corrected functions (F i(lambda ), measured depending on (A3). An independent claim is also included for a kit (I), for restorable calibration of (A) (preferably a fluorescence measuring system), comprising majority of fluorescence spectrum and corrected fluorescence spectrum of (i) in computer-readable form and/or an indication of an internet side, on which the corrected fluorescence spectrum are retrievable, where (i) is such that their spectrally corrected fluorescence spectrum (A2) together given to a spectral region exhibits in the UV spectral region with lambda of 700 nm fluorescence band of the corrected, in each case spectrally sequential fluorescence spectrum at its intersecting wavelength exhibit a minimum intensity of at least 20% of the respective maximum band intensity, each fluorescence band exhibits a half width (FWHM) and at least 1400 cm ->1>of unstructured, edge-free band process respectively with maximum in the relevant spectral region with a spectral dissolution of 1 nm.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | Kit, its use and method for calibration of a photoluminescence measuring system |
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