CURRENT SENSING CIRCUIT FOR USE IN A CURRENT MEASUREMENT PROBE

CURRENT SENSING CIRCUIT FOR USE IN A CURRENT MEASUREMENT PROBE

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: DANDY, JONATHAN S, MENDE, MICHAEL J, CRANE, ALBERT, S., JR
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator DANDY, JONATHAN S
MENDE, MICHAEL J
CRANE, ALBERT, S., JR
description
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2016430B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2016430B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2016430B13</originalsourceid><addsrcrecordid>eNrjZLBzDg0KcvULUQh29Qv29HNXcPYMcg71DFFw8w9SCA12VfD0U3BUgCnydXUMDg1y9QWxA4L8nVx5GFjTEnOKU3mhNDeDgptriLOHbmpBfnxqcUFicmpeakm8a4CRgaGZibGBk6ExEUoACe0pqQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CURRENT SENSING CIRCUIT FOR USE IN A CURRENT MEASUREMENT PROBE</title><source>esp@cenet</source><creator>DANDY, JONATHAN S ; MENDE, MICHAEL J ; CRANE, ALBERT, S., JR</creator><creatorcontrib>DANDY, JONATHAN S ; MENDE, MICHAEL J ; CRANE, ALBERT, S., JR</creatorcontrib><language>eng ; fre ; ger</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20100106&amp;DB=EPODOC&amp;CC=EP&amp;NR=2016430B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20100106&amp;DB=EPODOC&amp;CC=EP&amp;NR=2016430B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DANDY, JONATHAN S</creatorcontrib><creatorcontrib>MENDE, MICHAEL J</creatorcontrib><creatorcontrib>CRANE, ALBERT, S., JR</creatorcontrib><title>CURRENT SENSING CIRCUIT FOR USE IN A CURRENT MEASUREMENT PROBE</title><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLBzDg0KcvULUQh29Qv29HNXcPYMcg71DFFw8w9SCA12VfD0U3BUgCnydXUMDg1y9QWxA4L8nVx5GFjTEnOKU3mhNDeDgptriLOHbmpBfnxqcUFicmpeakm8a4CRgaGZibGBk6ExEUoACe0pqQ</recordid><startdate>20100106</startdate><enddate>20100106</enddate><creator>DANDY, JONATHAN S</creator><creator>MENDE, MICHAEL J</creator><creator>CRANE, ALBERT, S., JR</creator><scope>EVB</scope></search><sort><creationdate>20100106</creationdate><title>CURRENT SENSING CIRCUIT FOR USE IN A CURRENT MEASUREMENT PROBE</title><author>DANDY, JONATHAN S ; MENDE, MICHAEL J ; CRANE, ALBERT, S., JR</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2016430B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2010</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>DANDY, JONATHAN S</creatorcontrib><creatorcontrib>MENDE, MICHAEL J</creatorcontrib><creatorcontrib>CRANE, ALBERT, S., JR</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DANDY, JONATHAN S</au><au>MENDE, MICHAEL J</au><au>CRANE, ALBERT, S., JR</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CURRENT SENSING CIRCUIT FOR USE IN A CURRENT MEASUREMENT PROBE</title><date>2010-01-06</date><risdate>2010</risdate><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP2016430B1
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title CURRENT SENSING CIRCUIT FOR USE IN A CURRENT MEASUREMENT PROBE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T14%3A43%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DANDY,%20JONATHAN%20S&rft.date=2010-01-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2016430B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true