Test device and method for testing at least one electronic control system
The test device (2) which exhibits an addressable physical memory is connected to a control system (1) which is to be tested. An environmental model interacts through data cable by outputting environmental model data to control system and by accepting control system data from control system. The tes...
Gespeichert in:
Hauptverfasser: | , , , , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | GROSE BOERGER, RALF MILLER, EDUARD BRUSKI, NICOLA DR WOELFER, THOMAS LEINFELLNER, ROBERT |
description | The test device (2) which exhibits an addressable physical memory is connected to a control system (1) which is to be tested. An environmental model interacts through data cable by outputting environmental model data to control system and by accepting control system data from control system. The test device modifies environmental model variables which are filed at physical address in memory location with addressable physical memory. An unit allocates environmental model variable to allocated physical memory of the memory which is filed so as to be readable. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2009525B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2009525B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2009525B13</originalsourceid><addsrcrecordid>eNqNijEKwkAUBdNYiHqHdwEhRlLYKhHtLNKHZfdFFzb_h-xH8PZu4QGsZmBmXd17ZkPgO3rCScBEe2nAqAuspChPOEOiK5sKwURvi0r08CrFEvInG6dttRpdytz9uKlw7frLbc9ZB-bZeQpt6B5NXZ_apj0fjn8sX199NC8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Test device and method for testing at least one electronic control system</title><source>esp@cenet</source><creator>GROSE BOERGER, RALF ; MILLER, EDUARD ; BRUSKI, NICOLA DR ; WOELFER, THOMAS ; LEINFELLNER, ROBERT</creator><creatorcontrib>GROSE BOERGER, RALF ; MILLER, EDUARD ; BRUSKI, NICOLA DR ; WOELFER, THOMAS ; LEINFELLNER, ROBERT</creatorcontrib><description>The test device (2) which exhibits an addressable physical memory is connected to a control system (1) which is to be tested. An environmental model interacts through data cable by outputting environmental model data to control system and by accepting control system data from control system. The test device modifies environmental model variables which are filed at physical address in memory location with addressable physical memory. An unit allocates environmental model variable to allocated physical memory of the memory which is filed so as to be readable.</description><language>eng ; fre ; ger</language><subject>CALCULATING ; COMPUTING ; CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20111102&DB=EPODOC&CC=EP&NR=2009525B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20111102&DB=EPODOC&CC=EP&NR=2009525B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>GROSE BOERGER, RALF</creatorcontrib><creatorcontrib>MILLER, EDUARD</creatorcontrib><creatorcontrib>BRUSKI, NICOLA DR</creatorcontrib><creatorcontrib>WOELFER, THOMAS</creatorcontrib><creatorcontrib>LEINFELLNER, ROBERT</creatorcontrib><title>Test device and method for testing at least one electronic control system</title><description>The test device (2) which exhibits an addressable physical memory is connected to a control system (1) which is to be tested. An environmental model interacts through data cable by outputting environmental model data to control system and by accepting control system data from control system. The test device modifies environmental model variables which are filed at physical address in memory location with addressable physical memory. An unit allocates environmental model variable to allocated physical memory of the memory which is filed so as to be readable.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNijEKwkAUBdNYiHqHdwEhRlLYKhHtLNKHZfdFFzb_h-xH8PZu4QGsZmBmXd17ZkPgO3rCScBEe2nAqAuspChPOEOiK5sKwURvi0r08CrFEvInG6dttRpdytz9uKlw7frLbc9ZB-bZeQpt6B5NXZ_apj0fjn8sX199NC8</recordid><startdate>20111102</startdate><enddate>20111102</enddate><creator>GROSE BOERGER, RALF</creator><creator>MILLER, EDUARD</creator><creator>BRUSKI, NICOLA DR</creator><creator>WOELFER, THOMAS</creator><creator>LEINFELLNER, ROBERT</creator><scope>EVB</scope></search><sort><creationdate>20111102</creationdate><title>Test device and method for testing at least one electronic control system</title><author>GROSE BOERGER, RALF ; MILLER, EDUARD ; BRUSKI, NICOLA DR ; WOELFER, THOMAS ; LEINFELLNER, ROBERT</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2009525B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2011</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><toplevel>online_resources</toplevel><creatorcontrib>GROSE BOERGER, RALF</creatorcontrib><creatorcontrib>MILLER, EDUARD</creatorcontrib><creatorcontrib>BRUSKI, NICOLA DR</creatorcontrib><creatorcontrib>WOELFER, THOMAS</creatorcontrib><creatorcontrib>LEINFELLNER, ROBERT</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>GROSE BOERGER, RALF</au><au>MILLER, EDUARD</au><au>BRUSKI, NICOLA DR</au><au>WOELFER, THOMAS</au><au>LEINFELLNER, ROBERT</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Test device and method for testing at least one electronic control system</title><date>2011-11-02</date><risdate>2011</risdate><abstract>The test device (2) which exhibits an addressable physical memory is connected to a control system (1) which is to be tested. An environmental model interacts through data cable by outputting environmental model data to control system and by accepting control system data from control system. The test device modifies environmental model variables which are filed at physical address in memory location with addressable physical memory. An unit allocates environmental model variable to allocated physical memory of the memory which is filed so as to be readable.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng ; fre ; ger |
recordid | cdi_epo_espacenet_EP2009525B1 |
source | esp@cenet |
subjects | CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING ELECTRIC DIGITAL DATA PROCESSING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING |
title | Test device and method for testing at least one electronic control system |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T02%3A51%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=GROSE%20BOERGER,%20RALF&rft.date=2011-11-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2009525B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |