SYSTEM FOR DETECTING MOTION OF A BODY
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre ; ger |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | KLAVER, RENE, G VAN EIJK, JAN RUIJL, THEO, A.M RENKENS, MICHAEL, J.M |
| description | |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP1931947A2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP1931947A2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP1931947A23</originalsourceid><addsrcrecordid>eNrjZFANjgwOcfVVcPMPUnBxDXF1DvH0c1fw9Q_x9PdT8HdTcFRw8neJ5GFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BhpbGhpYm5o5GxkQoAQBLriK3</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEM FOR DETECTING MOTION OF A BODY</title><source>esp@cenet</source><creator>KLAVER, RENE, G ; VAN EIJK, JAN ; RUIJL, THEO, A.M ; RENKENS, MICHAEL, J.M</creator><creatorcontrib>KLAVER, RENE, G ; VAN EIJK, JAN ; RUIJL, THEO, A.M ; RENKENS, MICHAEL, J.M</creatorcontrib><language>eng ; fre ; ger</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; CINEMATOGRAPHY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080618&DB=EPODOC&CC=EP&NR=1931947A2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080618&DB=EPODOC&CC=EP&NR=1931947A2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KLAVER, RENE, G</creatorcontrib><creatorcontrib>VAN EIJK, JAN</creatorcontrib><creatorcontrib>RUIJL, THEO, A.M</creatorcontrib><creatorcontrib>RENKENS, MICHAEL, J.M</creatorcontrib><title>SYSTEM FOR DETECTING MOTION OF A BODY</title><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFANjgwOcfVVcPMPUnBxDXF1DvH0c1fw9Q_x9PdT8HdTcFRw8neJ5GFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BhpbGhpYm5o5GxkQoAQBLriK3</recordid><startdate>20080618</startdate><enddate>20080618</enddate><creator>KLAVER, RENE, G</creator><creator>VAN EIJK, JAN</creator><creator>RUIJL, THEO, A.M</creator><creator>RENKENS, MICHAEL, J.M</creator><scope>EVB</scope></search><sort><creationdate>20080618</creationdate><title>SYSTEM FOR DETECTING MOTION OF A BODY</title><author>KLAVER, RENE, G ; VAN EIJK, JAN ; RUIJL, THEO, A.M ; RENKENS, MICHAEL, J.M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP1931947A23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2008</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KLAVER, RENE, G</creatorcontrib><creatorcontrib>VAN EIJK, JAN</creatorcontrib><creatorcontrib>RUIJL, THEO, A.M</creatorcontrib><creatorcontrib>RENKENS, MICHAEL, J.M</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KLAVER, RENE, G</au><au>VAN EIJK, JAN</au><au>RUIJL, THEO, A.M</au><au>RENKENS, MICHAEL, J.M</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEM FOR DETECTING MOTION OF A BODY</title><date>2008-06-18</date><risdate>2008</risdate><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre ; ger |
| recordid | cdi_epo_espacenet_EP1931947A2 |
| source | esp@cenet |
| subjects | APPARATUS SPECIALLY ADAPTED THEREFOR ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY MATERIALS THEREFOR MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS TARIFF METERING APPARATUS TESTING |
| title | SYSTEM FOR DETECTING MOTION OF A BODY |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T22%3A16%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KLAVER,%20RENE,%20G&rft.date=2008-06-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP1931947A2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |