METHOD AND APPARATUS FOR EXPEDITING ANALYSIS OF SAMPLES
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creator | TAFTO, SVEND, A MYHRVOLD, ELISABETH, M AKPORIAYE, DUNCAN, E DAHL, IVAR, M KVERNHEIM, ARNE, L KARLSSON, ARNE |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP1926989A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP1926989A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP1926989A13</originalsourceid><addsrcrecordid>eNrjZDD3dQ3x8HdRcPQD4oAAxyDHkNBgBTf_IAXXiABXF88QTz93oKSjT2SwZ7CCv5tCsKNvgI9rMA8Da1piTnEqL5TmZlBwcw1x9tBNLciPTy0uSExOzUstiXcNMLQ0MrO0sHQ0NCZCCQDtFSfp</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD AND APPARATUS FOR EXPEDITING ANALYSIS OF SAMPLES</title><source>esp@cenet</source><creator>TAFTO, SVEND, A ; MYHRVOLD, ELISABETH, M ; AKPORIAYE, DUNCAN, E ; DAHL, IVAR, M ; KVERNHEIM, ARNE, L ; KARLSSON, ARNE</creator><creatorcontrib>TAFTO, SVEND, A ; MYHRVOLD, ELISABETH, M ; AKPORIAYE, DUNCAN, E ; DAHL, IVAR, M ; KVERNHEIM, ARNE, L ; KARLSSON, ARNE</creatorcontrib><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080604&DB=EPODOC&CC=EP&NR=1926989A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080604&DB=EPODOC&CC=EP&NR=1926989A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TAFTO, SVEND, A</creatorcontrib><creatorcontrib>MYHRVOLD, ELISABETH, M</creatorcontrib><creatorcontrib>AKPORIAYE, DUNCAN, E</creatorcontrib><creatorcontrib>DAHL, IVAR, M</creatorcontrib><creatorcontrib>KVERNHEIM, ARNE, L</creatorcontrib><creatorcontrib>KARLSSON, ARNE</creatorcontrib><title>METHOD AND APPARATUS FOR EXPEDITING ANALYSIS OF SAMPLES</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD3dQ3x8HdRcPQD4oAAxyDHkNBgBTf_IAXXiABXF88QTz93oKSjT2SwZ7CCv5tCsKNvgI9rMA8Da1piTnEqL5TmZlBwcw1x9tBNLciPTy0uSExOzUstiXcNMLQ0MrO0sHQ0NCZCCQDtFSfp</recordid><startdate>20080604</startdate><enddate>20080604</enddate><creator>TAFTO, SVEND, A</creator><creator>MYHRVOLD, ELISABETH, M</creator><creator>AKPORIAYE, DUNCAN, E</creator><creator>DAHL, IVAR, M</creator><creator>KVERNHEIM, ARNE, L</creator><creator>KARLSSON, ARNE</creator><scope>EVB</scope></search><sort><creationdate>20080604</creationdate><title>METHOD AND APPARATUS FOR EXPEDITING ANALYSIS OF SAMPLES</title><author>TAFTO, SVEND, A ; MYHRVOLD, ELISABETH, M ; AKPORIAYE, DUNCAN, E ; DAHL, IVAR, M ; KVERNHEIM, ARNE, L ; KARLSSON, ARNE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP1926989A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2008</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TAFTO, SVEND, A</creatorcontrib><creatorcontrib>MYHRVOLD, ELISABETH, M</creatorcontrib><creatorcontrib>AKPORIAYE, DUNCAN, E</creatorcontrib><creatorcontrib>DAHL, IVAR, M</creatorcontrib><creatorcontrib>KVERNHEIM, ARNE, L</creatorcontrib><creatorcontrib>KARLSSON, ARNE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TAFTO, SVEND, A</au><au>MYHRVOLD, ELISABETH, M</au><au>AKPORIAYE, DUNCAN, E</au><au>DAHL, IVAR, M</au><au>KVERNHEIM, ARNE, L</au><au>KARLSSON, ARNE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND APPARATUS FOR EXPEDITING ANALYSIS OF SAMPLES</title><date>2008-06-04</date><risdate>2008</risdate><oa>free_for_read</oa></addata></record> |
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language | eng ; fre ; ger |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | METHOD AND APPARATUS FOR EXPEDITING ANALYSIS OF SAMPLES |
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