Automatic set-up for instrument functions

Automatic set-up for instrument functions

Machine-implemented methods and apparatuses to automatically set-up a signal processing system are described. The signal processing system is set to a first bandwidth. A sampling frequency of the signal processing system is set to a first sampling frequency. Next, first samples of first signals are...

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Hauptverfasser: Bachalo, William D, Payne, Gregory Allan, Ibrahim, Khalid M
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator Bachalo, William D
Payne, Gregory Allan
Ibrahim, Khalid M
description Machine-implemented methods and apparatuses to automatically set-up a signal processing system are described. The signal processing system is set to a first bandwidth. A sampling frequency of the signal processing system is set to a first sampling frequency. Next, first samples of first signals are received at the first bandwidth and the first sampling frequency. First parameters of the first signals based on the first samples are determined. Next, a second sampling frequency is determined based on the first parameters to sample second samples. The first parameters of the first signals may be a mean transit time, a minimum transit time, a mean frequency of the signals, and a standard deviation of the frequency of the signals. Next, a mixer frequency is determined based on the first parameters. A low pass filter is set based on the mixer frequency.
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Automatic set-up for instrument functions
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