DEVICE AND METHOD FOR ASSESSING THE QUALITY CLASS OF AN OBJECT TO BE TESTED

A device for assessing a quality class of an object to be tested includes a unit for detecting a test signal from the object to be tested. Furthermore, the device for assessing includes a unit for providing a stochastic Markov model including states and transitions between states on the basis of ref...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HOFFMANN, RUEDIGER, EICHNER, MATTHIAS, WOLFF, MATTHIAS, TSCHOEPE, CONSTANZE, HENTSCHEL, DIETER
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator HOFFMANN, RUEDIGER
EICHNER, MATTHIAS
WOLFF, MATTHIAS
TSCHOEPE, CONSTANZE
HENTSCHEL, DIETER
description A device for assessing a quality class of an object to be tested includes a unit for detecting a test signal from the object to be tested. Furthermore, the device for assessing includes a unit for providing a stochastic Markov model including states and transitions between states on the basis of reference measurements of objects of known quality classes, and a unit for evaluating the test signal using the stochastic Markov model. In addition, the device for assessing includes a unit for associating the object to be tested with a quality class based on the evaluation of the test signal. Such a device has the advantage to be able to perform a more precise association of an object to be tested with a quality class as compared to prior art.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP1733223B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP1733223B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP1733223B13</originalsourceid><addsrcrecordid>eNqNyr0KwjAUhuEsDqLew3cDDm0G5_ycmGht1HMUnEqROIkW6v1jBy_A6YWXZ672nq7JEUzrcSCJ2SPkMwwzMad2C4mE08U0SW5wzfSRw6SR7Y6cQDIsQYiF_FLNHv1zLKtfFwqBxMV1Gd5dGYf-Xl7l09Gx2mhd19pW-g_yBeNJLI8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DEVICE AND METHOD FOR ASSESSING THE QUALITY CLASS OF AN OBJECT TO BE TESTED</title><source>esp@cenet</source><creator>HOFFMANN, RUEDIGER ; EICHNER, MATTHIAS ; WOLFF, MATTHIAS ; TSCHOEPE, CONSTANZE ; HENTSCHEL, DIETER</creator><creatorcontrib>HOFFMANN, RUEDIGER ; EICHNER, MATTHIAS ; WOLFF, MATTHIAS ; TSCHOEPE, CONSTANZE ; HENTSCHEL, DIETER</creatorcontrib><description>A device for assessing a quality class of an object to be tested includes a unit for detecting a test signal from the object to be tested. Furthermore, the device for assessing includes a unit for providing a stochastic Markov model including states and transitions between states on the basis of reference measurements of objects of known quality classes, and a unit for evaluating the test signal using the stochastic Markov model. In addition, the device for assessing includes a unit for associating the object to be tested with a quality class based on the evaluation of the test signal. Such a device has the advantage to be able to perform a more precise association of an object to be tested with a quality class as compared to prior art.</description><language>eng ; fre ; ger</language><subject>ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDEDFOR ELSEWHERE ; CHECKING-DEVICES ; CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; GENERATING RANDOM NUMBERS ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGISTERING OR INDICATING THE WORKING OF MACHINES ; REGULATING ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR ; TIME OR ATTENDANCE REGISTERS ; VOTING OR LOTTERY APPARATUS</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080116&amp;DB=EPODOC&amp;CC=EP&amp;NR=1733223B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080116&amp;DB=EPODOC&amp;CC=EP&amp;NR=1733223B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HOFFMANN, RUEDIGER</creatorcontrib><creatorcontrib>EICHNER, MATTHIAS</creatorcontrib><creatorcontrib>WOLFF, MATTHIAS</creatorcontrib><creatorcontrib>TSCHOEPE, CONSTANZE</creatorcontrib><creatorcontrib>HENTSCHEL, DIETER</creatorcontrib><title>DEVICE AND METHOD FOR ASSESSING THE QUALITY CLASS OF AN OBJECT TO BE TESTED</title><description>A device for assessing a quality class of an object to be tested includes a unit for detecting a test signal from the object to be tested. Furthermore, the device for assessing includes a unit for providing a stochastic Markov model including states and transitions between states on the basis of reference measurements of objects of known quality classes, and a unit for evaluating the test signal using the stochastic Markov model. In addition, the device for assessing includes a unit for associating the object to be tested with a quality class based on the evaluation of the test signal. Such a device has the advantage to be able to perform a more precise association of an object to be tested with a quality class as compared to prior art.</description><subject>ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDEDFOR ELSEWHERE</subject><subject>CHECKING-DEVICES</subject><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>GENERATING RANDOM NUMBERS</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGISTERING OR INDICATING THE WORKING OF MACHINES</subject><subject>REGULATING</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><subject>TIME OR ATTENDANCE REGISTERS</subject><subject>VOTING OR LOTTERY APPARATUS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyr0KwjAUhuEsDqLew3cDDm0G5_ycmGht1HMUnEqROIkW6v1jBy_A6YWXZ672nq7JEUzrcSCJ2SPkMwwzMad2C4mE08U0SW5wzfSRw6SR7Y6cQDIsQYiF_FLNHv1zLKtfFwqBxMV1Gd5dGYf-Xl7l09Gx2mhd19pW-g_yBeNJLI8</recordid><startdate>20080116</startdate><enddate>20080116</enddate><creator>HOFFMANN, RUEDIGER</creator><creator>EICHNER, MATTHIAS</creator><creator>WOLFF, MATTHIAS</creator><creator>TSCHOEPE, CONSTANZE</creator><creator>HENTSCHEL, DIETER</creator><scope>EVB</scope></search><sort><creationdate>20080116</creationdate><title>DEVICE AND METHOD FOR ASSESSING THE QUALITY CLASS OF AN OBJECT TO BE TESTED</title><author>HOFFMANN, RUEDIGER ; EICHNER, MATTHIAS ; WOLFF, MATTHIAS ; TSCHOEPE, CONSTANZE ; HENTSCHEL, DIETER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP1733223B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2008</creationdate><topic>ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDEDFOR ELSEWHERE</topic><topic>CHECKING-DEVICES</topic><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>GENERATING RANDOM NUMBERS</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGISTERING OR INDICATING THE WORKING OF MACHINES</topic><topic>REGULATING</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><topic>TIME OR ATTENDANCE REGISTERS</topic><topic>VOTING OR LOTTERY APPARATUS</topic><toplevel>online_resources</toplevel><creatorcontrib>HOFFMANN, RUEDIGER</creatorcontrib><creatorcontrib>EICHNER, MATTHIAS</creatorcontrib><creatorcontrib>WOLFF, MATTHIAS</creatorcontrib><creatorcontrib>TSCHOEPE, CONSTANZE</creatorcontrib><creatorcontrib>HENTSCHEL, DIETER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HOFFMANN, RUEDIGER</au><au>EICHNER, MATTHIAS</au><au>WOLFF, MATTHIAS</au><au>TSCHOEPE, CONSTANZE</au><au>HENTSCHEL, DIETER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DEVICE AND METHOD FOR ASSESSING THE QUALITY CLASS OF AN OBJECT TO BE TESTED</title><date>2008-01-16</date><risdate>2008</risdate><abstract>A device for assessing a quality class of an object to be tested includes a unit for detecting a test signal from the object to be tested. Furthermore, the device for assessing includes a unit for providing a stochastic Markov model including states and transitions between states on the basis of reference measurements of objects of known quality classes, and a unit for evaluating the test signal using the stochastic Markov model. In addition, the device for assessing includes a unit for associating the object to be tested with a quality class based on the evaluation of the test signal. Such a device has the advantage to be able to perform a more precise association of an object to be tested with a quality class as compared to prior art.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP1733223B1
source esp@cenet
subjects ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDEDFOR ELSEWHERE
CHECKING-DEVICES
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
GENERATING RANDOM NUMBERS
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGISTERING OR INDICATING THE WORKING OF MACHINES
REGULATING
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
TIME OR ATTENDANCE REGISTERS
VOTING OR LOTTERY APPARATUS
title DEVICE AND METHOD FOR ASSESSING THE QUALITY CLASS OF AN OBJECT TO BE TESTED
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T11%3A21%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HOFFMANN,%20RUEDIGER&rft.date=2008-01-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP1733223B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true